再生破断:从非活动电压域中恢复存储能量用于节能片上系统

A. Najafi, J. Rudell, V. Sathe
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引用次数: 0

摘要

现代片上系统(soc)经常关闭单个电压域,以节省各种应用中的泄漏功率,从大规模异构计算到物联网应用中的超低功耗系统。然而,相当大的能量存储在电容的断电区域是通过泄漏损失。在本文中,我们提出了一种方法,利用现有的电压调节器,利用低开销的全数字运行时控制系统,将这种能量从禁用电压域恢复到电源中。在工业65nm CMOS工艺中进行的模拟实验表明,在0.4V—1V的操作系统电压范围内,超过90%的存储能量可以被回收。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Regenerative Breaking: Recovering Stored Energy from Inactive Voltage Domains for Energy-efficient Systems-on-Chip
Modern Systems-on-Chip(SoCs) frequently power-off individual voltage domains to save leakage power across a variety of applications, from large-scale heterogeneous computing to ultra-low power systems in IoT applications. However, the considerable energy stored within the capacitance of the powered-off domain is lost through leakage. In this paper, we present an approach to leverage existing voltage regulators to recover this energy from the disabled voltage-domain back into the supply using a low-overhead all-digital runtime control system. Simulation experiments conducted in an industrial 65nm CMOS process indicate that over 90% of the stored energy can be recovered across a range of operating system voltages from 0.4V--1V.
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