{"title":"再生破断:从非活动电压域中恢复存储能量用于节能片上系统","authors":"A. Najafi, J. Rudell, V. Sathe","doi":"10.1145/2934583.2934621","DOIUrl":null,"url":null,"abstract":"Modern Systems-on-Chip(SoCs) frequently power-off individual voltage domains to save leakage power across a variety of applications, from large-scale heterogeneous computing to ultra-low power systems in IoT applications. However, the considerable energy stored within the capacitance of the powered-off domain is lost through leakage. In this paper, we present an approach to leverage existing voltage regulators to recover this energy from the disabled voltage-domain back into the supply using a low-overhead all-digital runtime control system. Simulation experiments conducted in an industrial 65nm CMOS process indicate that over 90% of the stored energy can be recovered across a range of operating system voltages from 0.4V--1V.","PeriodicalId":142716,"journal":{"name":"Proceedings of the 2016 International Symposium on Low Power Electronics and Design","volume":"27 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Regenerative Breaking: Recovering Stored Energy from Inactive Voltage Domains for Energy-efficient Systems-on-Chip\",\"authors\":\"A. Najafi, J. Rudell, V. Sathe\",\"doi\":\"10.1145/2934583.2934621\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Modern Systems-on-Chip(SoCs) frequently power-off individual voltage domains to save leakage power across a variety of applications, from large-scale heterogeneous computing to ultra-low power systems in IoT applications. However, the considerable energy stored within the capacitance of the powered-off domain is lost through leakage. In this paper, we present an approach to leverage existing voltage regulators to recover this energy from the disabled voltage-domain back into the supply using a low-overhead all-digital runtime control system. Simulation experiments conducted in an industrial 65nm CMOS process indicate that over 90% of the stored energy can be recovered across a range of operating system voltages from 0.4V--1V.\",\"PeriodicalId\":142716,\"journal\":{\"name\":\"Proceedings of the 2016 International Symposium on Low Power Electronics and Design\",\"volume\":\"27 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-08-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2016 International Symposium on Low Power Electronics and Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2934583.2934621\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2016 International Symposium on Low Power Electronics and Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2934583.2934621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Regenerative Breaking: Recovering Stored Energy from Inactive Voltage Domains for Energy-efficient Systems-on-Chip
Modern Systems-on-Chip(SoCs) frequently power-off individual voltage domains to save leakage power across a variety of applications, from large-scale heterogeneous computing to ultra-low power systems in IoT applications. However, the considerable energy stored within the capacitance of the powered-off domain is lost through leakage. In this paper, we present an approach to leverage existing voltage regulators to recover this energy from the disabled voltage-domain back into the supply using a low-overhead all-digital runtime control system. Simulation experiments conducted in an industrial 65nm CMOS process indicate that over 90% of the stored energy can be recovered across a range of operating system voltages from 0.4V--1V.