高精度标准电容箱的研制

Dongxue Dai, Xiaobing He, Pan Jin, Wei Wang
{"title":"高精度标准电容箱的研制","authors":"Dongxue Dai, Xiaobing He, Pan Jin, Wei Wang","doi":"10.1109/CPEM.2014.6898368","DOIUrl":null,"url":null,"abstract":"This paper describes the dielectric material and the structure of the standard capacitance box (decade capacitor) developed by NIM with the capacitance range of 1pF to 0.1μF and the accuracy of 50ppm at 1 kHz. High stability and high accuracy of the standard capacitance box mainly derives from a choice of dielectric materials that are fused-silica and nano-ceramic, and each capacitor in the box contained a constant temperature control system. Special decade switch with the three-terminal full shield structure can eliminate the capacitance variance caused by the stray capacitance so that higher accuracy and lower zero capacitance can be achieved.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Development of high accuracy standard capacitance box\",\"authors\":\"Dongxue Dai, Xiaobing He, Pan Jin, Wei Wang\",\"doi\":\"10.1109/CPEM.2014.6898368\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the dielectric material and the structure of the standard capacitance box (decade capacitor) developed by NIM with the capacitance range of 1pF to 0.1μF and the accuracy of 50ppm at 1 kHz. High stability and high accuracy of the standard capacitance box mainly derives from a choice of dielectric materials that are fused-silica and nano-ceramic, and each capacitor in the box contained a constant temperature control system. Special decade switch with the three-terminal full shield structure can eliminate the capacitance variance caused by the stray capacitance so that higher accuracy and lower zero capacitance can be achieved.\",\"PeriodicalId\":256575,\"journal\":{\"name\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"volume\":\"95 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.2014.6898368\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2014.6898368","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

介绍了NIM研制的电容范围为1pF ~ 0.1μF, 1khz时精度为50ppm的标准电容盒(十进电容)的介电材料和结构。标准电容盒的高稳定性和高精度主要源于选用了熔融二氧化硅和纳米陶瓷作为介质材料,并且每个电容盒内都有恒温控制系统。特殊的十进开关采用三端全屏蔽结构,可以消除杂散电容引起的电容方差,从而达到更高的精度和更低的零容。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of high accuracy standard capacitance box
This paper describes the dielectric material and the structure of the standard capacitance box (decade capacitor) developed by NIM with the capacitance range of 1pF to 0.1μF and the accuracy of 50ppm at 1 kHz. High stability and high accuracy of the standard capacitance box mainly derives from a choice of dielectric materials that are fused-silica and nano-ceramic, and each capacitor in the box contained a constant temperature control system. Special decade switch with the three-terminal full shield structure can eliminate the capacitance variance caused by the stray capacitance so that higher accuracy and lower zero capacitance can be achieved.
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