基于YBaCuO和普通金属薄膜的微带WGM谐振器q因子研究

Oleksander Barannik, I. Protsenko, Mykola Cherpak, Svitlana Vitusevich
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引用次数: 0

摘要

通过比较基于HTS和普通金属薄膜的微带(平面)窃窃廊模式(WGM)谐振器的q因子,分析了WGM谐振器的耗散特性。分析在1.5 GHz到40 GHz的频率范围内进行。通过对部分q因子的数值模拟表明,在77 K温度下,微带WGM YBa2Cu3O7-δ基谐振器的总q因子(本征)值在整个频率范围内超过了相似的铜基谐振器的q因子值。这种优势在1.5 GHz时约为2个数量级,在40 GHz时约为5倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Q-Factor of Microstrip WGM Resonators Based on YBaCuO and Normal Metal Films
The paper analyzes the dissipative properties of microstrip (planar) whispering gallery mode (WGM) resonators by comparing the Q-factors of resonators based on both HTS and normal metal films. The analysis was performed in the frequency range from 1.5 GHz to 40 GHz. By using numerical simulation of partial Q-factors it is shown that the value of the total (eigen) Q-factor at a temperature of 77 K for the microstrip WGM YBa2Cu3O7-δ- based resonator exceeds the Q-factor value obtained for the similar copper-based resonator in the entire frequency range under study. This superiority is about 2 orders of magnitude at 1.5 GHz and about 5 times at 40 GHz.
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