用于集成电路电磁兼容测试的改进TEM-cell

2017 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON) Pub Date : 2017-09-01 DOI:10.1109/SIBIRCON.2017.8109915

A. V. Demakov, M. Komnatnov

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引用次数: 6

摘要

本文介绍了可用于集成电路在5 GHz频率范围内的辐射敏感性和发射测试的TEM-cell的结构。介绍了该电池的结构特点和与传统电池相比的优点。完成了结构的电动力学仿真，给出了反射系数|511|和透射系数|S21|的频率相关性分析结果。仿真结果表明，在考虑的频率范围内，与50欧姆馈线(|S11|≤- 20 dB)匹配良好，损耗低(|S21|≥- 3 dB)。介绍了试验体中电场强度不均匀性的评价。在30×30×5 mm3的测试体积中，其值不超过±3db。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Improved TEM-cell for EMC tests of integrated circuits

In this paper, the construction of TEM-cell, which can be used for tests on radiated susceptibility and emissions of integrated circuits in the frequency range up to 5 GHz, is presented. Constructional features and advantages of proposed TEM-cell compared with classic constriction are described. Electrodynamic simulation of construction is completed and results of the analysis of frequency dependencies of the magnitude of reflection |511| and transmission |S21| coefficients are presented. Results of the simulation showed good matching with the 50 Ohm feeder (|S11| ≤ −20 dB) and low losses (|S21| ≥ −3 dB) in considered frequency range. Evaluation of non-uniformity of electric field strength in test volume is represented. Its value doesn't exceed ±3 dB in the test volume of 30×30×5 mm³.

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来源期刊

2017 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON)

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