基于sram的FPGA:使用评估板的高剂量测试方法

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745649

Sergeh Vartanian, G. Allen, D. Thorbourn

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引用次数: 0

摘要

本文介绍了在Xilinx Kintex UltraScale (20nm)现场可编程门阵列评估板上使用60Co和2 MeV电子源进行高水平总电离剂量测试的低成本和有效的方法和结果。

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SRAM-Based FPGA: High Dose Test Methods Using Evaluation Boards

We present low-cost and effective methods and results for high levels of Total Ionizing Dose testing performed on the Xilinx Kintex UltraScale (20nm) Field-Programmable Gate Array evaluation board using 60Co and 2 MeV electron sources.

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来源期刊

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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