{"title":"曲线慢波结构高频特性分析","authors":"Zheng Wen, Jirun Luo, Yu Fan, Chen Yang, Fang Zhu, Mingkui Zhu, Wei Guo, Y. Gong, Jinjun Feng","doi":"10.1109/IVEC45766.2020.9520615","DOIUrl":null,"url":null,"abstract":"Analysis of high frequency characteristics for a meander line slow-wave structure (ML-SWS) has been carried out by field-matching methods with the dyadic Green’s function. The effect from thickness of the meander line was considered and the theoretical results had been compared with the simulation ones.","PeriodicalId":170853,"journal":{"name":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of High Frequency Characteristics for a Meander Line Slow-wave Structure\",\"authors\":\"Zheng Wen, Jirun Luo, Yu Fan, Chen Yang, Fang Zhu, Mingkui Zhu, Wei Guo, Y. Gong, Jinjun Feng\",\"doi\":\"10.1109/IVEC45766.2020.9520615\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analysis of high frequency characteristics for a meander line slow-wave structure (ML-SWS) has been carried out by field-matching methods with the dyadic Green’s function. The effect from thickness of the meander line was considered and the theoretical results had been compared with the simulation ones.\",\"PeriodicalId\":170853,\"journal\":{\"name\":\"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC45766.2020.9520615\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC45766.2020.9520615","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of High Frequency Characteristics for a Meander Line Slow-wave Structure
Analysis of high frequency characteristics for a meander line slow-wave structure (ML-SWS) has been carried out by field-matching methods with the dyadic Green’s function. The effect from thickness of the meander line was considered and the theoretical results had been compared with the simulation ones.