硅腔在4开尔文与热噪声有限的性能

J. Robinson, E. Oelker, W. Zhang, L. Sonderhouse, W. Milner, J. L. Hall, C. Sanner, J. Ye, D. Matei, T. Legero, F. Riehle, U. Sterr
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引用次数: 0

摘要

研究了低温超稳定硅光学腔在4k下的热噪声限制性能。与其他两个超稳谐振器的三角比较表明,4 K系统在5秒到30秒的平均时间内,很大程度上受到7\ × 10^{-17}$附近的闪烁频率下限的限制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Silicon Cavity at 4 Kelvin with Thermal Noise Limited Performance
We present the thermal noise limited performance of a cryogenic ultrastable silicon optical cavity operated at 4 K. A three-cornered comparison with two other ultrastable resonantors shows that the 4 K system is largely limited by a flicker frequency floor near $7\times 10^{-17}$ for averaging times from 5 seconds to 30 seconds.
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