{"title":"生产测试的当前签名[CMOS ic]","authors":"A. Gattiker, P. Nigh, D. Grosch, Wojciech Maly","doi":"10.1109/IDDQ.1996.557804","DOIUrl":null,"url":null,"abstract":"The concept of the current signature has been proposed as a means for improving testing resolution over single-threshold Iddq testing. This paper postulates a practical methodology for applying the current signature concept for die selection in a production environment.","PeriodicalId":285207,"journal":{"name":"Digest of Papers 1996 IEEE International Workshop on IDDQ Testing","volume":"138 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"Current signatures for production testing [CMOS ICs]\",\"authors\":\"A. Gattiker, P. Nigh, D. Grosch, Wojciech Maly\",\"doi\":\"10.1109/IDDQ.1996.557804\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The concept of the current signature has been proposed as a means for improving testing resolution over single-threshold Iddq testing. This paper postulates a practical methodology for applying the current signature concept for die selection in a production environment.\",\"PeriodicalId\":285207,\"journal\":{\"name\":\"Digest of Papers 1996 IEEE International Workshop on IDDQ Testing\",\"volume\":\"138 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers 1996 IEEE International Workshop on IDDQ Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IDDQ.1996.557804\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1996 IEEE International Workshop on IDDQ Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDDQ.1996.557804","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Current signatures for production testing [CMOS ICs]
The concept of the current signature has been proposed as a means for improving testing resolution over single-threshold Iddq testing. This paper postulates a practical methodology for applying the current signature concept for die selection in a production environment.