{"title":"氮化镓纳米结构阴极谐振隧道二极管","authors":"N. Goncharuk, N. Karushkin","doi":"10.1109/CRMICO.2008.4676530","DOIUrl":null,"url":null,"abstract":"Microwave characteristics of a new type of a resonant tunneling diode (RTD) based on GaN nanostructural cathode with two-layer AlxGa1-xN-GaN coating are investigated theoretically in framework the model of vacuum RTD . Optimum parameters of cathode coating layers were found at which the upper frequency of diode negative conductance band is in sub-millimeter range of wave length.","PeriodicalId":328074,"journal":{"name":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Resonant tunneling diode based on nitride gallium nanostructural cathode\",\"authors\":\"N. Goncharuk, N. Karushkin\",\"doi\":\"10.1109/CRMICO.2008.4676530\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Microwave characteristics of a new type of a resonant tunneling diode (RTD) based on GaN nanostructural cathode with two-layer AlxGa1-xN-GaN coating are investigated theoretically in framework the model of vacuum RTD . Optimum parameters of cathode coating layers were found at which the upper frequency of diode negative conductance band is in sub-millimeter range of wave length.\",\"PeriodicalId\":328074,\"journal\":{\"name\":\"2008 18th International Crimean Conference - Microwave & Telecommunication Technology\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 18th International Crimean Conference - Microwave & Telecommunication Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2008.4676530\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2008.4676530","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Resonant tunneling diode based on nitride gallium nanostructural cathode
Microwave characteristics of a new type of a resonant tunneling diode (RTD) based on GaN nanostructural cathode with two-layer AlxGa1-xN-GaN coating are investigated theoretically in framework the model of vacuum RTD . Optimum parameters of cathode coating layers were found at which the upper frequency of diode negative conductance band is in sub-millimeter range of wave length.