Thickness-invariant permittivity determination of materials from calibration-independent measurements

This paper presents a new method for extracting relative complex permittivity (εr) of dielectric materials by eliminating calibration standards. To validate proposed method it is compared with well known three techniques in literature. All measurements are done by using waveguide measurement techniques which is broadband over X-band (8.2GHz-12.4GHz) frequency range with VNA. While these three methods necessitate calibration standards, proposed method is calibration independent (free). Experimental results of proposed method are in good agreement when compared with other methods in literature. Moreover, this new proposed technique can be implemented for extraction of material characterization of new studies in the future.