基于fpga的7-ENOB 600 MSample/s ADC,无任何外部元件

Lukas Leuenberger, D. Amiet, Tao Wei, P. Zbinden
{"title":"基于fpga的7-ENOB 600 MSample/s ADC,无任何外部元件","authors":"Lukas Leuenberger, D. Amiet, Tao Wei, P. Zbinden","doi":"10.1145/3431920.3439287","DOIUrl":null,"url":null,"abstract":"Analog to digital converters (ADCs) are indispensable nowadays. Analog signals are digitized earlier and earlier in the processing chain to reduce the need for complex analog signal processing. For this reason, ADCs are often integrated directly into field-programmable gate arrays (FPGA) or microprocessors. However, such ADCs are designed for a specific set of requirements with limited flexibility. In this paper, a new structure of an FPGA-based ADC is proposed. The ADC is based on the slope ADC, where a time-to-digital converter (TDC) measures the time from the beginning of a reference slope until the slope reaches the voltage-to-be-measured. Only FPGA-internal elements are used to build the ADC. It is fully reconfigurable and does not require any external components. This innovation offers the flexibility to convert almost any digital input/output (I/O) into an ADC. Considering the very high number of digital I/O ports available in today's FPGA systems, this enables the construction of a massive and powerful ADC array directly on a standard FPGA. The proposed ADC has a resolution of 9.3 bit and achieves an effective number of bits (ENOB) of 7 at a sample rate of 600 MSample/s. The differential nonlinearity (DNL) ranges from -0.9 to 0.9 bit, and the integral nonlinearity (INL) is in the range between -1.1 and 0.9 bit. An alternative version of the ADC operates at 1.2 GSample/s and achieves an ENOB of 5.3.","PeriodicalId":386071,"journal":{"name":"The 2021 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"An FPGA-based 7-ENOB 600 MSample/s ADC without any External Components\",\"authors\":\"Lukas Leuenberger, D. Amiet, Tao Wei, P. Zbinden\",\"doi\":\"10.1145/3431920.3439287\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analog to digital converters (ADCs) are indispensable nowadays. Analog signals are digitized earlier and earlier in the processing chain to reduce the need for complex analog signal processing. For this reason, ADCs are often integrated directly into field-programmable gate arrays (FPGA) or microprocessors. However, such ADCs are designed for a specific set of requirements with limited flexibility. In this paper, a new structure of an FPGA-based ADC is proposed. The ADC is based on the slope ADC, where a time-to-digital converter (TDC) measures the time from the beginning of a reference slope until the slope reaches the voltage-to-be-measured. Only FPGA-internal elements are used to build the ADC. It is fully reconfigurable and does not require any external components. This innovation offers the flexibility to convert almost any digital input/output (I/O) into an ADC. Considering the very high number of digital I/O ports available in today's FPGA systems, this enables the construction of a massive and powerful ADC array directly on a standard FPGA. The proposed ADC has a resolution of 9.3 bit and achieves an effective number of bits (ENOB) of 7 at a sample rate of 600 MSample/s. The differential nonlinearity (DNL) ranges from -0.9 to 0.9 bit, and the integral nonlinearity (INL) is in the range between -1.1 and 0.9 bit. An alternative version of the ADC operates at 1.2 GSample/s and achieves an ENOB of 5.3.\",\"PeriodicalId\":386071,\"journal\":{\"name\":\"The 2021 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-02-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 2021 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3431920.3439287\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 2021 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3431920.3439287","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

如今,模数转换器(adc)是必不可少的。模拟信号在处理链中被越来越早地数字化,以减少对复杂模拟信号处理的需要。因此,adc通常直接集成到现场可编程门阵列(FPGA)或微处理器中。然而,这种adc是为一组特定的要求而设计的,灵活性有限。本文提出了一种新的基于fpga的ADC结构。该ADC基于斜率ADC,其中时间-数字转换器(TDC)测量从参考斜率开始到斜率达到待测电压的时间。仅使用fpga内部元件来构建ADC。它是完全可重构的,不需要任何外部组件。这种创新提供了将几乎任何数字输入/输出(I/O)转换为ADC的灵活性。考虑到当今FPGA系统中可用的数字I/O端口数量非常多,这使得可以直接在标准FPGA上构建庞大而强大的ADC阵列。该ADC的分辨率为9.3位,在600 MSample/s的采样率下,有效比特数(ENOB)为7。差分非线性(DNL)在-0.9 ~ 0.9 bit之间,积分非线性(INL)在-1.1 ~ 0.9 bit之间。另一种ADC的工作速度为1.2 GSample/s, ENOB为5.3。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An FPGA-based 7-ENOB 600 MSample/s ADC without any External Components
Analog to digital converters (ADCs) are indispensable nowadays. Analog signals are digitized earlier and earlier in the processing chain to reduce the need for complex analog signal processing. For this reason, ADCs are often integrated directly into field-programmable gate arrays (FPGA) or microprocessors. However, such ADCs are designed for a specific set of requirements with limited flexibility. In this paper, a new structure of an FPGA-based ADC is proposed. The ADC is based on the slope ADC, where a time-to-digital converter (TDC) measures the time from the beginning of a reference slope until the slope reaches the voltage-to-be-measured. Only FPGA-internal elements are used to build the ADC. It is fully reconfigurable and does not require any external components. This innovation offers the flexibility to convert almost any digital input/output (I/O) into an ADC. Considering the very high number of digital I/O ports available in today's FPGA systems, this enables the construction of a massive and powerful ADC array directly on a standard FPGA. The proposed ADC has a resolution of 9.3 bit and achieves an effective number of bits (ENOB) of 7 at a sample rate of 600 MSample/s. The differential nonlinearity (DNL) ranges from -0.9 to 0.9 bit, and the integral nonlinearity (INL) is in the range between -1.1 and 0.9 bit. An alternative version of the ADC operates at 1.2 GSample/s and achieves an ENOB of 5.3.
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