Xiaofeng Bai, Zijie Liao, Qian Wang, Jianning Yin, Xingwen Li
{"title":"断路器动触头回退现象的研究","authors":"Xiaofeng Bai, Zijie Liao, Qian Wang, Jianning Yin, Xingwen Li","doi":"10.1109/HLM51431.2021.9671104","DOIUrl":null,"url":null,"abstract":"Movable contact fallback may have disadvantageous effect on the interruption performance of low voltage molded case circuit breaker (MCCB). Based on short circuit experiments of one MCCB product, the occurrence of movable contact fallback phenomenon was predicted. In order to analyze the phenomenon more detailed, a multi-physical coupled model was proposed to simulate the interruption process. The model included three parts: firstly, the dynamic model of the operation mechanism was developed by ADAMS software, and its validity was verified by measuring the angular displacement of the main axis; secondly, the electro-magnetic forces acting on the movable contact and the armature of the magnetic release were calculated based on finite element method; finally, by embedding some self-programmed codes into ADAMS software to consider the above-mentioned electro-magnetic forces, the whole interruption process could be simulated. It demonstrates that the proposed model could be used to evaluate the interruption performance of MCCB qualitatively, especially for the movable contact fallback phenomenon.","PeriodicalId":338653,"journal":{"name":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study of the movable contact fallback phenomenon in MCCB\",\"authors\":\"Xiaofeng Bai, Zijie Liao, Qian Wang, Jianning Yin, Xingwen Li\",\"doi\":\"10.1109/HLM51431.2021.9671104\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Movable contact fallback may have disadvantageous effect on the interruption performance of low voltage molded case circuit breaker (MCCB). Based on short circuit experiments of one MCCB product, the occurrence of movable contact fallback phenomenon was predicted. In order to analyze the phenomenon more detailed, a multi-physical coupled model was proposed to simulate the interruption process. The model included three parts: firstly, the dynamic model of the operation mechanism was developed by ADAMS software, and its validity was verified by measuring the angular displacement of the main axis; secondly, the electro-magnetic forces acting on the movable contact and the armature of the magnetic release were calculated based on finite element method; finally, by embedding some self-programmed codes into ADAMS software to consider the above-mentioned electro-magnetic forces, the whole interruption process could be simulated. It demonstrates that the proposed model could be used to evaluate the interruption performance of MCCB qualitatively, especially for the movable contact fallback phenomenon.\",\"PeriodicalId\":338653,\"journal\":{\"name\":\"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLM51431.2021.9671104\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 66th Holm Conference on Electrical Contacts (HLM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLM51431.2021.9671104","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of the movable contact fallback phenomenon in MCCB
Movable contact fallback may have disadvantageous effect on the interruption performance of low voltage molded case circuit breaker (MCCB). Based on short circuit experiments of one MCCB product, the occurrence of movable contact fallback phenomenon was predicted. In order to analyze the phenomenon more detailed, a multi-physical coupled model was proposed to simulate the interruption process. The model included three parts: firstly, the dynamic model of the operation mechanism was developed by ADAMS software, and its validity was verified by measuring the angular displacement of the main axis; secondly, the electro-magnetic forces acting on the movable contact and the armature of the magnetic release were calculated based on finite element method; finally, by embedding some self-programmed codes into ADAMS software to consider the above-mentioned electro-magnetic forces, the whole interruption process could be simulated. It demonstrates that the proposed model could be used to evaluate the interruption performance of MCCB qualitatively, especially for the movable contact fallback phenomenon.