C. Wei, Y. Tkachenko, J.C.M. Hwang, K.E. Smith, A. Peake
{"title":"MMIC功率放大器内节点波形探测","authors":"C. Wei, Y. Tkachenko, J.C.M. Hwang, K.E. Smith, A. Peake","doi":"10.1109/MCS.1995.470975","DOIUrl":null,"url":null,"abstract":"A novel internal-node waveform probing technique has been demonstrated on a MMIC. The error of the measurement and its perturbance to circuit operation was estimated and verified to be less than 20%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location.<<ETX>>","PeriodicalId":325779,"journal":{"name":"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Internal-node waveform probing of MMIC power amplifiers\",\"authors\":\"C. Wei, Y. Tkachenko, J.C.M. Hwang, K.E. Smith, A. Peake\",\"doi\":\"10.1109/MCS.1995.470975\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel internal-node waveform probing technique has been demonstrated on a MMIC. The error of the measurement and its perturbance to circuit operation was estimated and verified to be less than 20%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location.<<ETX>>\",\"PeriodicalId\":325779,\"journal\":{\"name\":\"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MCS.1995.470975\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCS.1995.470975","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Internal-node waveform probing of MMIC power amplifiers
A novel internal-node waveform probing technique has been demonstrated on a MMIC. The error of the measurement and its perturbance to circuit operation was estimated and verified to be less than 20%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location.<>