用于光刻透镜制造的HeCd相位测量干涉仪

R. Mahany
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引用次数: 1

摘要

相位测量干涉仪长期以来被用作精密光学元件和透镜系统制造的计量系统。它们的计算能力加上最近在快速数据处理方面的进展,使用户能够以经济有效的方式执行复杂的分析。本文将描述使用商用PMI软件系统,该系统集成了专门的干涉仪设计,用于执行精密光刻物镜的过程测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
HeCd Phase Measuring Interferometer Used in Photolithographic Lens Manufacture
Phase measuring interferometers have long been used as metrology systems in the manufacturing of precision optical elements and lens systems. Their computational power coupled with recent advances in rapid data taking permit users to perform complex analysis in a cost effective fashion. This paper will describe the use of a commercially available PMI Software System which was integrated with a specialized interferometer design to perform in process testing of a precision photolithographic objective lens.
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