介质挤压电缆的老化模型

J. Crine, J. Parpal, G. Lessard
{"title":"介质挤压电缆的老化模型","authors":"J. Crine, J. Parpal, G. Lessard","doi":"10.1109/ICSD.1989.69218","DOIUrl":null,"url":null,"abstract":"The authors present a model of electrical aging of extruded cables based on actual data and realistic experimental conditions. It is shown that a simple model partially based on the rate theory associated with the name of Eyring describes very well the aging of polyethylene (PE), crosslinked PE, and ethylene-propylene rubber cables under a wide variety of conditions. The significance of the physical and thermodynamic parameters used in the model is discussed in relation to the polymer morphology. It is speculated that severe and irreversible electric aging of dielectrics is preceded by the formation of microcavities in the 50-100-AA range.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"51","resultStr":"{\"title\":\"A model of aging of dielectric extruded cables\",\"authors\":\"J. Crine, J. Parpal, G. Lessard\",\"doi\":\"10.1109/ICSD.1989.69218\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a model of electrical aging of extruded cables based on actual data and realistic experimental conditions. It is shown that a simple model partially based on the rate theory associated with the name of Eyring describes very well the aging of polyethylene (PE), crosslinked PE, and ethylene-propylene rubber cables under a wide variety of conditions. The significance of the physical and thermodynamic parameters used in the model is discussed in relation to the polymer morphology. It is speculated that severe and irreversible electric aging of dielectrics is preceded by the formation of microcavities in the 50-100-AA range.<<ETX>>\",\"PeriodicalId\":184126,\"journal\":{\"name\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"51\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1989.69218\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 51

摘要

根据实际数据和实际实验条件,建立了挤压电缆的电老化模型。结果表明,一个部分基于速率理论的简单模型很好地描述了聚乙烯(PE)、交联聚乙烯(PE)和乙烯丙烯橡胶电缆在各种条件下的老化。讨论了模型中使用的物理和热力学参数与聚合物形态的关系。据推测,在50-100-AA范围内,电介质发生严重且不可逆的电老化之前会形成微腔。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A model of aging of dielectric extruded cables
The authors present a model of electrical aging of extruded cables based on actual data and realistic experimental conditions. It is shown that a simple model partially based on the rate theory associated with the name of Eyring describes very well the aging of polyethylene (PE), crosslinked PE, and ethylene-propylene rubber cables under a wide variety of conditions. The significance of the physical and thermodynamic parameters used in the model is discussed in relation to the polymer morphology. It is speculated that severe and irreversible electric aging of dielectrics is preceded by the formation of microcavities in the 50-100-AA range.<>
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