{"title":"DYTEST:一种使用动态可测试性措施来加速测试生成的自学习算法","authors":"W. Mao, M. Ciletti","doi":"10.1109/DAC.1988.14822","DOIUrl":null,"url":null,"abstract":"The authors present a self-learning algorithm using a dynamic testability measure to accelerate test generation. They introduce the concepts of full-logic-value label-backward implication, dependent backtrack, and K-limited backtracks. Results indicating a high fault coverage are presented for ten benchmark combinational circuits.<<ETX>>","PeriodicalId":230716,"journal":{"name":"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation\",\"authors\":\"W. Mao, M. Ciletti\",\"doi\":\"10.1109/DAC.1988.14822\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a self-learning algorithm using a dynamic testability measure to accelerate test generation. They introduce the concepts of full-logic-value label-backward implication, dependent backtrack, and K-limited backtracks. Results indicating a high fault coverage are presented for ten benchmark combinational circuits.<<ETX>>\",\"PeriodicalId\":230716,\"journal\":{\"name\":\"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1988.14822\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1988.14822","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation
The authors present a self-learning algorithm using a dynamic testability measure to accelerate test generation. They introduce the concepts of full-logic-value label-backward implication, dependent backtrack, and K-limited backtracks. Results indicating a high fault coverage are presented for ten benchmark combinational circuits.<>
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