Baking Status Characterization of Baked Food Image Based on Superpixel Segmentation

The temperature field distribution of the oven directly affects the quality of the baked food. The traditional oven performance research mainly focuses on the heating method in the simulated oven, lacking quantitative analysis of the baked food. In this paper, the digital image processing technology is used to segment and extract different baking status of the baked food in order to qualitatively and quantitatively expresses the internal temperature field distribution of the oven. Firstly, the image of baked food is captured by high-definition digital camera. And then it will be preprocessed to obtain a denoised image with only baked food area. Thirdly, the simple linear iterative clustering (SLIC) segmentation is used to extract the different baking status. The experimental results show that the simple linear iterative clustering (SLIC) segmentation algorithm can digitally express the baking status in the form of superpixels. The proposed method can qualitatively and quantitatively reflect the distribution of the temperature field inside the oven corresponding to the baked food image, which provide a basis for further evaluation of the heat distribution field inside the oven.