RTL中变化意识的形式时序验证

Jayanand Asok Kumar, Shobha Vasudevan
{"title":"RTL中变化意识的形式时序验证","authors":"Jayanand Asok Kumar, Shobha Vasudevan","doi":"10.1109/VLSID.2011.48","DOIUrl":null,"url":null,"abstract":"ariations in timing can occur due to multiple sources on a chip. Many circuit level statistical techniques are used to analyze timing in the presence of these sources of variation. It is desirable to have “variation awareness” at the Register Transfer Level (RTL), and estimate block level delay distributions early in the design cycle, to evaluate design choices quickly and minimize post-synthesis simulation costs. We introduce SHARPE, a rigorous, systematic methodology to verify design correctness in RTL in the presence of variations. In this paper, we describe SHARPE in the context of computing statistical delay invariants in the presence of input variations. We treat the RTL source code as a program and use static program analysis techniques to compute probabilities. We model the probabilistic RTL modules as Discrete Time Markov Chains (DTMCs) that are then checked formally for probabilistic invariants using PRISM, a probabilistic model checker. Our technique is illustrated on the RTL description of the data path of OR1200, an open source embedded processor. We demonstrate the enhanced scalability of SHARPE by applying compositional reasoning for probabilistic model checking.","PeriodicalId":371062,"journal":{"name":"2011 24th Internatioal Conference on VLSI Design","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Variation-Conscious Formal Timing Verification in RTL\",\"authors\":\"Jayanand Asok Kumar, Shobha Vasudevan\",\"doi\":\"10.1109/VLSID.2011.48\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ariations in timing can occur due to multiple sources on a chip. Many circuit level statistical techniques are used to analyze timing in the presence of these sources of variation. It is desirable to have “variation awareness” at the Register Transfer Level (RTL), and estimate block level delay distributions early in the design cycle, to evaluate design choices quickly and minimize post-synthesis simulation costs. We introduce SHARPE, a rigorous, systematic methodology to verify design correctness in RTL in the presence of variations. In this paper, we describe SHARPE in the context of computing statistical delay invariants in the presence of input variations. We treat the RTL source code as a program and use static program analysis techniques to compute probabilities. We model the probabilistic RTL modules as Discrete Time Markov Chains (DTMCs) that are then checked formally for probabilistic invariants using PRISM, a probabilistic model checker. Our technique is illustrated on the RTL description of the data path of OR1200, an open source embedded processor. We demonstrate the enhanced scalability of SHARPE by applying compositional reasoning for probabilistic model checking.\",\"PeriodicalId\":371062,\"journal\":{\"name\":\"2011 24th Internatioal Conference on VLSI Design\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 24th Internatioal Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSID.2011.48\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 24th Internatioal Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSID.2011.48","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

由于芯片上有多个源,可能会发生时序变化。许多电路级统计技术被用于分析存在这些变化源的时序。在寄存器传输级别(RTL)具有“变化意识”是可取的,并且在设计周期的早期估计块级延迟分布,以快速评估设计选择并最小化合成后仿真成本。我们介绍夏普,一个严格的,系统的方法来验证设计正确性的RTL在变化的存在。在本文中,我们描述了SHARPE在计算存在输入变化的统计延迟不变量的背景下。我们将RTL源代码视为一个程序,并使用静态程序分析技术来计算概率。我们将概率RTL模块建模为离散时间马尔可夫链(dtmc),然后使用概率模型检查器PRISM正式检查概率不变量。我们的技术在开源嵌入式处理器OR1200的数据路径的RTL描述上进行了说明。我们通过将组合推理应用于概率模型检查来证明SHARPE的增强可扩展性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Variation-Conscious Formal Timing Verification in RTL
ariations in timing can occur due to multiple sources on a chip. Many circuit level statistical techniques are used to analyze timing in the presence of these sources of variation. It is desirable to have “variation awareness” at the Register Transfer Level (RTL), and estimate block level delay distributions early in the design cycle, to evaluate design choices quickly and minimize post-synthesis simulation costs. We introduce SHARPE, a rigorous, systematic methodology to verify design correctness in RTL in the presence of variations. In this paper, we describe SHARPE in the context of computing statistical delay invariants in the presence of input variations. We treat the RTL source code as a program and use static program analysis techniques to compute probabilities. We model the probabilistic RTL modules as Discrete Time Markov Chains (DTMCs) that are then checked formally for probabilistic invariants using PRISM, a probabilistic model checker. Our technique is illustrated on the RTL description of the data path of OR1200, an open source embedded processor. We demonstrate the enhanced scalability of SHARPE by applying compositional reasoning for probabilistic model checking.
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