{"title":"铁电SPICE模型，测试和拟合","authors":"S. Summerfelt, John Rodriguez, H. McAdams","doi":"10.1109/ISAF.2008.4693963","DOIUrl":null,"url":null,"abstract":"Design of ferroelectric memories, F-RAMs, requires an accurate ferroelectric SPICE model. The goal of a good SPICE model is to predict the behavior of the ferroelectric capacitor in the circuit environment.","PeriodicalId":228914,"journal":{"name":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","volume":"152 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Ferroelectric SPICE model, testing and fitting\",\"authors\":\"S. Summerfelt, John Rodriguez, H. McAdams\",\"doi\":\"10.1109/ISAF.2008.4693963\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Design of ferroelectric memories, F-RAMs, requires an accurate ferroelectric SPICE model. The goal of a good SPICE model is to predict the behavior of the ferroelectric capacitor in the circuit environment.\",\"PeriodicalId\":228914,\"journal\":{\"name\":\"2008 17th IEEE International Symposium on the Applications of Ferroelectrics\",\"volume\":\"152 6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 17th IEEE International Symposium on the Applications of Ferroelectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2008.4693963\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2008.4693963","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of ferroelectric memories, F-RAMs, requires an accurate ferroelectric SPICE model. The goal of a good SPICE model is to predict the behavior of the ferroelectric capacitor in the circuit environment.
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