基于MEMS薄膜的新型x波段直列式频率检测器

Zhenxiang Yi, X. Liao
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引用次数: 0

摘要

本文提出了一种基于MEMS薄膜的新型x波段直列式频率检测器。在本设计中,MEMS膜位于CPW传输线的信号线上方,作为耦合电容。输入功率的一定百分比,作为频率的函数,耦合到微波功率传感器。最后,基于塞贝克效应,通过测量功率传感器的输出热电压,推导出入射射频信号的频率。入射功率不完全耗散,可以实现在线频率检测。采用GaAs - MMIC工艺设计、建模并制作了内联式功率传感器。在8-12GHz范围内,回波损耗小于-13dB,插入损耗接近1.3dB。射频频率测量显示输出热电压随频率增加而增加。然而,功率传感器的频率性能较差,导致了测量与理论的偏差。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel in-line type frequency detector based on MEMS membrane for X-band application
In this paper, a novel in-line type frequency detector is proposed based on MEMS Membrane for X-band application. In the design, a MEMS membrane stands above the signal line of the CPW transmission line and acts as a coupling capacitance. A certain percentage of the input power, as a function of frequency, is coupled to the microwave power sensor. Finally, the frequency of the incident RF signal is deduced by measuring the output thermovoltage of the power sensor based on Seebeck effect. The incident power is not dissipated completely and the proposed design can achieve inline frequency detection. The inline type power sensor is designed, modeled and fabricated by GaAs MMIC process. The measured return loss is less than -13dB and the insertion loss is close to 1.3dB over 8-12GHz. The RF frequency measurement shows the output thermovoltage increases with the frequency. However, the poor frequency performance of the power sensor leads to the deviation of the measurement and theory.
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