Filip Vaverka, M. Smetana, D. Gombarska, L. Janoušek
{"title":"扫描频率涡流检测在材料缺陷评定中的应用","authors":"Filip Vaverka, M. Smetana, D. Gombarska, L. Janoušek","doi":"10.1109/ELEKTRO53996.2022.9803473","DOIUrl":null,"url":null,"abstract":"The application of sweep frequency eddy current testing to defect detection and evaluation is discussed in this work. We focus mainly on the examination of the possibility of defect parameters evaluation using data that are acquired at the surrounding of the defect. The measurements performed in the vicinity of the artificial defect are examined. Experiments had been performed on a stainless-steel plate with artificial defects using a ferrite core probe. Presented results show the influence of present defect in the material mainly on the real part of the sensed signal. The position of the probe relative to the defect is also reflected in the value of the real component of the response signal. The present findings might help to solve the defect parameters evaluation problem.","PeriodicalId":396752,"journal":{"name":"2022 ELEKTRO (ELEKTRO)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Application of Sweep Frequency Eddy Current Testing to Material Defect Evaluation\",\"authors\":\"Filip Vaverka, M. Smetana, D. Gombarska, L. Janoušek\",\"doi\":\"10.1109/ELEKTRO53996.2022.9803473\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The application of sweep frequency eddy current testing to defect detection and evaluation is discussed in this work. We focus mainly on the examination of the possibility of defect parameters evaluation using data that are acquired at the surrounding of the defect. The measurements performed in the vicinity of the artificial defect are examined. Experiments had been performed on a stainless-steel plate with artificial defects using a ferrite core probe. Presented results show the influence of present defect in the material mainly on the real part of the sensed signal. The position of the probe relative to the defect is also reflected in the value of the real component of the response signal. The present findings might help to solve the defect parameters evaluation problem.\",\"PeriodicalId\":396752,\"journal\":{\"name\":\"2022 ELEKTRO (ELEKTRO)\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 ELEKTRO (ELEKTRO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELEKTRO53996.2022.9803473\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 ELEKTRO (ELEKTRO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELEKTRO53996.2022.9803473","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of Sweep Frequency Eddy Current Testing to Material Defect Evaluation
The application of sweep frequency eddy current testing to defect detection and evaluation is discussed in this work. We focus mainly on the examination of the possibility of defect parameters evaluation using data that are acquired at the surrounding of the defect. The measurements performed in the vicinity of the artificial defect are examined. Experiments had been performed on a stainless-steel plate with artificial defects using a ferrite core probe. Presented results show the influence of present defect in the material mainly on the real part of the sensed signal. The position of the probe relative to the defect is also reflected in the value of the real component of the response signal. The present findings might help to solve the defect parameters evaluation problem.