Mohini Agrawal, Adarsh Anand, Alessandro Barbiero, N. Bhatt, F. De Caro, L. Cui, Antônio Carlos Lopes da Costa, Vanderley de Vasconcelos, Chen Fang, Soufiane Gasmi, M. Kvassay, Dongjin Lee, Preeti Malik, M. Manglik, L. Nautiyal, Rong Pan, Brian A. Polin, L. Pustylnik, J. Rabcan, M. Ram, A. Raso, A. Rotshtein, Patrik Rusnak, Luis Mejia Sanchez, W. A. Soares, A. Vaccaro, D. Villacci, S. Werbińska-Wojciechowska, Petek Yontay
{"title":"贡献者","authors":"Mohini Agrawal, Adarsh Anand, Alessandro Barbiero, N. Bhatt, F. De Caro, L. Cui, Antônio Carlos Lopes da Costa, Vanderley de Vasconcelos, Chen Fang, Soufiane Gasmi, M. Kvassay, Dongjin Lee, Preeti Malik, M. Manglik, L. Nautiyal, Rong Pan, Brian A. Polin, L. Pustylnik, J. Rabcan, M. Ram, A. Raso, A. Rotshtein, Patrik Rusnak, Luis Mejia Sanchez, W. A. Soares, A. Vaccaro, D. Villacci, S. Werbińska-Wojciechowska, Petek Yontay","doi":"10.1016/b978-0-12-815906-4.09989-9","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":285525,"journal":{"name":"Advances in System Reliability Engineering","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Contributors\",\"authors\":\"Mohini Agrawal, Adarsh Anand, Alessandro Barbiero, N. Bhatt, F. De Caro, L. Cui, Antônio Carlos Lopes da Costa, Vanderley de Vasconcelos, Chen Fang, Soufiane Gasmi, M. Kvassay, Dongjin Lee, Preeti Malik, M. Manglik, L. Nautiyal, Rong Pan, Brian A. Polin, L. Pustylnik, J. Rabcan, M. Ram, A. Raso, A. Rotshtein, Patrik Rusnak, Luis Mejia Sanchez, W. A. Soares, A. Vaccaro, D. Villacci, S. Werbińska-Wojciechowska, Petek Yontay\",\"doi\":\"10.1016/b978-0-12-815906-4.09989-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":285525,\"journal\":{\"name\":\"Advances in System Reliability Engineering\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in System Reliability Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/b978-0-12-815906-4.09989-9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in System Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/b978-0-12-815906-4.09989-9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}