{"title":"功率晶体管开关过程分析","authors":"P. Procházka, I. Pazdera, Jan Mikláš, R. Cipín","doi":"10.1109/EDPE.2019.8883874","DOIUrl":null,"url":null,"abstract":"The paper deals with analysis of power transistor switching process. Influence of parasitic elements on current and voltage waveforms is discussed separately. The power transistor is analyzed with help of transistor conductance varying in time. The analysis of power transistor switching process is fundamental, simple and its utilization is not limited with power transistor technology. The measuring test bench for collecting demanded voltage and current waveforms is also described.","PeriodicalId":353978,"journal":{"name":"2019 International Conference on Electrical Drives & Power Electronics (EDPE)","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of Power Transistor Switching Process\",\"authors\":\"P. Procházka, I. Pazdera, Jan Mikláš, R. Cipín\",\"doi\":\"10.1109/EDPE.2019.8883874\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper deals with analysis of power transistor switching process. Influence of parasitic elements on current and voltage waveforms is discussed separately. The power transistor is analyzed with help of transistor conductance varying in time. The analysis of power transistor switching process is fundamental, simple and its utilization is not limited with power transistor technology. The measuring test bench for collecting demanded voltage and current waveforms is also described.\",\"PeriodicalId\":353978,\"journal\":{\"name\":\"2019 International Conference on Electrical Drives & Power Electronics (EDPE)\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Electrical Drives & Power Electronics (EDPE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDPE.2019.8883874\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Electrical Drives & Power Electronics (EDPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDPE.2019.8883874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The paper deals with analysis of power transistor switching process. Influence of parasitic elements on current and voltage waveforms is discussed separately. The power transistor is analyzed with help of transistor conductance varying in time. The analysis of power transistor switching process is fundamental, simple and its utilization is not limited with power transistor technology. The measuring test bench for collecting demanded voltage and current waveforms is also described.
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