{"title":"复杂电路功能测试中考虑异步信号的方法","authors":"C. Bellon, R. Velazco","doi":"10.1109/DAC.1984.1585843","DOIUrl":null,"url":null,"abstract":"The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"64 8-9","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Taking into Account Asynchronous Signals in Functional Test of Complex Circuits\",\"authors\":\"C. Bellon, R. Velazco\",\"doi\":\"10.1109/DAC.1984.1585843\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.\",\"PeriodicalId\":188431,\"journal\":{\"name\":\"21st Design Automation Conference Proceedings\",\"volume\":\"64 8-9\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Design Automation Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1984.1585843\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Taking into Account Asynchronous Signals in Functional Test of Complex Circuits
The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.