面向客户的测试-评估测试

Hede Ma
{"title":"面向客户的测试-评估测试","authors":"Hede Ma","doi":"10.1109/SECON.1994.324307","DOIUrl":null,"url":null,"abstract":"In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation.<<ETX>>","PeriodicalId":119615,"journal":{"name":"Proceedings of SOUTHEASTCON '94","volume":"136 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A customer-oriented test-estimation test\",\"authors\":\"Hede Ma\",\"doi\":\"10.1109/SECON.1994.324307\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation.<<ETX>>\",\"PeriodicalId\":119615,\"journal\":{\"name\":\"Proceedings of SOUTHEASTCON '94\",\"volume\":\"136 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-04-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of SOUTHEASTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.1994.324307\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of SOUTHEASTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.1994.324307","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了一种面向客户的测试方法——估计测试(COTET),将估计理论应用于小型测试中,以提高VLSI电路的错误检测速度和测试质量。为客户在COTET中有效地估计和生成测试参数,开发了一种算法。最后,将通过仿真对COTET进行评估,以验证其有效性。模拟结果将在报告中给出。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A customer-oriented test-estimation test
In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation.<>
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