{"title":"面向客户的测试-评估测试","authors":"Hede Ma","doi":"10.1109/SECON.1994.324307","DOIUrl":null,"url":null,"abstract":"In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation.<<ETX>>","PeriodicalId":119615,"journal":{"name":"Proceedings of SOUTHEASTCON '94","volume":"136 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A customer-oriented test-estimation test\",\"authors\":\"Hede Ma\",\"doi\":\"10.1109/SECON.1994.324307\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation.<<ETX>>\",\"PeriodicalId\":119615,\"journal\":{\"name\":\"Proceedings of SOUTHEASTCON '94\",\"volume\":\"136 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-04-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of SOUTHEASTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.1994.324307\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of SOUTHEASTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.1994.324307","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation.<>