{"title":"数字相关法在微观应变测量和材料性能表征中的应用","authors":"H. Lu","doi":"10.1115/imece1997-1119","DOIUrl":null,"url":null,"abstract":"The method of digital speckle correlation is introduced, so is the hardware system to implement the method. The advantages and the features of the technique are discussed and application examples are given. Owing to the high spatial resolution that this technique can achieve, the method is especially useful to measure small areas of an object, or a small component in an assembly, whether the surfaces under probing are planar or not. The applications have proved that the technique is a promising tool for the reliability study of microelectronic packages.","PeriodicalId":432053,"journal":{"name":"Manufacturing Science and Engineering: Volume 1","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Applications of Digital Correlation Method to Microscopic Strain Measurement and Materials’ Property Characterization\",\"authors\":\"H. Lu\",\"doi\":\"10.1115/imece1997-1119\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The method of digital speckle correlation is introduced, so is the hardware system to implement the method. The advantages and the features of the technique are discussed and application examples are given. Owing to the high spatial resolution that this technique can achieve, the method is especially useful to measure small areas of an object, or a small component in an assembly, whether the surfaces under probing are planar or not. The applications have proved that the technique is a promising tool for the reliability study of microelectronic packages.\",\"PeriodicalId\":432053,\"journal\":{\"name\":\"Manufacturing Science and Engineering: Volume 1\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Manufacturing Science and Engineering: Volume 1\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1115/imece1997-1119\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Manufacturing Science and Engineering: Volume 1","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1115/imece1997-1119","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Applications of Digital Correlation Method to Microscopic Strain Measurement and Materials’ Property Characterization
The method of digital speckle correlation is introduced, so is the hardware system to implement the method. The advantages and the features of the technique are discussed and application examples are given. Owing to the high spatial resolution that this technique can achieve, the method is especially useful to measure small areas of an object, or a small component in an assembly, whether the surfaces under probing are planar or not. The applications have proved that the technique is a promising tool for the reliability study of microelectronic packages.