晶圆探测环境中的表面波现象

E. Godshalk
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引用次数: 28

摘要

研究了微波和毫米波在介质板中的传播和沿介质板上共面传输线的传播,揭示了表面波现象可以解释的影响。这些表面波可以用晶片探头发射和接收,并影响共面传输线的传输特性。本文给出了显示表面波存在的测量数据,以及它们如何与晶圆探头和共面波导传输线相互作用。探索和量化最小化这些相互作用的方法。讨论了表面波对晶圆校准的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Surface Wave Phenomenon in Wafer Probing Environments
Investigation of microwave and millimeter wave propagation in dielectric slabs and along coplanar transmission lines on dielectric slabs, reveal effects that may be explained by surface wave phenomenon. These surface waves can be transmitted and received with wafer probes and influence the transmission characteristics of coplanar transmission lines. This paper presents measured data showing the presence of surface waves and how they interact with wafer probes and coplanar waveguide transmission lines. Methods for minimizing these interactions are explored and quantified. A discussion of surface wave effects on wafer calibrations is included.
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