采用LTCC技术的宽带微带到微带多层通流过渡

Chih-Chun Tsai, Yung-Shou Cheng, Ting-Yi Huang, R. Wu
{"title":"采用LTCC技术的宽带微带到微带多层通流过渡","authors":"Chih-Chun Tsai, Yung-Shou Cheng, Ting-Yi Huang, R. Wu","doi":"10.1109/EDAPS.2009.5403997","DOIUrl":null,"url":null,"abstract":"A wide-band microstrip-to-microstrip via transition used for connecting integrated circuits and antenna array in a multi-layered low-temperature co-fired ceramic substrate is investigated in this paper. The via transition is decomposed into external and internal segments to facilitate the design. The equivalent impedance of internal segment, consisting of multi-layered through-hole via with four ground vias, is calculated from the lump-circuit model generated by Ansoft Q3D Extractor. The electrical performance of the external segment, consisting of via to microstrip lines, is evaluated by the microstrip-to-coax transition to choose appropriate via physical parameters. Finally, the geometrical parameters of entire transition are obtained by combining the results of the external and internal segments. It has been demonstrated, through the simulation results by commercial software Ansoft HFSS, that the return loss is better than 19dB over a band from DC up to 70GHz with an in-band insertion loss better than 0.48dB.","PeriodicalId":370741,"journal":{"name":"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A wide-band microstrip-to-microstrip multi-layered via transition using LTCC technology\",\"authors\":\"Chih-Chun Tsai, Yung-Shou Cheng, Ting-Yi Huang, R. Wu\",\"doi\":\"10.1109/EDAPS.2009.5403997\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A wide-band microstrip-to-microstrip via transition used for connecting integrated circuits and antenna array in a multi-layered low-temperature co-fired ceramic substrate is investigated in this paper. The via transition is decomposed into external and internal segments to facilitate the design. The equivalent impedance of internal segment, consisting of multi-layered through-hole via with four ground vias, is calculated from the lump-circuit model generated by Ansoft Q3D Extractor. The electrical performance of the external segment, consisting of via to microstrip lines, is evaluated by the microstrip-to-coax transition to choose appropriate via physical parameters. Finally, the geometrical parameters of entire transition are obtained by combining the results of the external and internal segments. It has been demonstrated, through the simulation results by commercial software Ansoft HFSS, that the return loss is better than 19dB over a band from DC up to 70GHz with an in-band insertion loss better than 0.48dB.\",\"PeriodicalId\":370741,\"journal\":{\"name\":\"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS.2009.5403997\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2009.5403997","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

本文研究了一种在多层低温共烧陶瓷衬底上连接集成电路和天线阵列的宽带微带到微带过渡。通过过渡被分解为外部和内部段,以方便设计。利用Ansoft Q3D Extractor生成的集块电路模型,计算了由多层通孔通孔和四个接地通孔组成的内段的等效阻抗。由微带到微带线组成的外部段的电性能通过微带到同轴线的转换来评估,以选择适当的通过物理参数。最后,结合内外段的结果,得到整个过渡段的几何参数。通过商业软件Ansoft HFSS的仿真结果表明,在直流至70GHz范围内,回波损耗优于19dB,带内插入损耗优于0.48dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A wide-band microstrip-to-microstrip multi-layered via transition using LTCC technology
A wide-band microstrip-to-microstrip via transition used for connecting integrated circuits and antenna array in a multi-layered low-temperature co-fired ceramic substrate is investigated in this paper. The via transition is decomposed into external and internal segments to facilitate the design. The equivalent impedance of internal segment, consisting of multi-layered through-hole via with four ground vias, is calculated from the lump-circuit model generated by Ansoft Q3D Extractor. The electrical performance of the external segment, consisting of via to microstrip lines, is evaluated by the microstrip-to-coax transition to choose appropriate via physical parameters. Finally, the geometrical parameters of entire transition are obtained by combining the results of the external and internal segments. It has been demonstrated, through the simulation results by commercial software Ansoft HFSS, that the return loss is better than 19dB over a band from DC up to 70GHz with an in-band insertion loss better than 0.48dB.
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