商用USB IC软失效灵敏度测量方法及趋势分析

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI:10.1109/EMCSI38923.2020.9191592

Runbing Hua, O. Hoseini, Zhekun Peng, H. Shumiya, Shota Konno, K. Araki, D. Pommerenke, Donghyun Kim

{"title":"商用USB IC软失效灵敏度测量方法及趋势分析","authors":"Runbing Hua, O. Hoseini, Zhekun Peng, H. Shumiya, Shota Konno, K. Araki, D. Pommerenke, Donghyun Kim","doi":"10.1109/EMCSI38923.2020.9191592","DOIUrl":null,"url":null,"abstract":"An electrostatic discharge (ESD) happening on a commercial electronic device such as at the USB interface can induce soft-failure in the IC and disturb the normal operation of the device. This paper investigates the soft-failure behaviors of 14 commercial USB devices in order to obtain an insight into the overall sensitivity trend of such systems and into the severity of different soft-failures. A new analysis method is proposed in this paper. The considered parameters in this study include: injected pulse widths, pulse rise time, current levels, USB standard of the DUTS, etc. Soft-failures started to occur at a current of around 1 A, and nearly all configurations would show errors above 6 A.","PeriodicalId":189322,"journal":{"name":"2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Commercial USB IC Soft-Failure Sensitivity Measurement Method and Trend Analysis\",\"authors\":\"Runbing Hua, O. Hoseini, Zhekun Peng, H. Shumiya, Shota Konno, K. Araki, D. Pommerenke, Donghyun Kim\",\"doi\":\"10.1109/EMCSI38923.2020.9191592\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An electrostatic discharge (ESD) happening on a commercial electronic device such as at the USB interface can induce soft-failure in the IC and disturb the normal operation of the device. This paper investigates the soft-failure behaviors of 14 commercial USB devices in order to obtain an insight into the overall sensitivity trend of such systems and into the severity of different soft-failures. A new analysis method is proposed in this paper. The considered parameters in this study include: injected pulse widths, pulse rise time, current levels, USB standard of the DUTS, etc. Soft-failures started to occur at a current of around 1 A, and nearly all configurations would show errors above 6 A.\",\"PeriodicalId\":189322,\"journal\":{\"name\":\"2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCSI38923.2020.9191592\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCSI38923.2020.9191592","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在商用电子设备上，如USB接口上产生的静电放电(ESD)会引起集成电路的软失效，影响设备的正常工作。本文研究了14个商用USB设备的软故障行为，以了解此类系统的整体灵敏度趋势和不同软故障的严重程度。本文提出了一种新的分析方法。本研究考虑的参数包括:注入脉冲宽度、脉冲上升时间、电流水平、DUTS的USB标准等。软故障开始发生在电流为1 a左右，几乎所有的配置将显示错误超过6 a。

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Commercial USB IC Soft-Failure Sensitivity Measurement Method and Trend Analysis

An electrostatic discharge (ESD) happening on a commercial electronic device such as at the USB interface can induce soft-failure in the IC and disturb the normal operation of the device. This paper investigates the soft-failure behaviors of 14 commercial USB devices in order to obtain an insight into the overall sensitivity trend of such systems and into the severity of different soft-failures. A new analysis method is proposed in this paper. The considered parameters in this study include: injected pulse widths, pulse rise time, current levels, USB standard of the DUTS, etc. Soft-failures started to occur at a current of around 1 A, and nearly all configurations would show errors above 6 A.

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2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

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