{"title":"评价埃米尔对OpAmps的有效性","authors":"Marco Brignone Aimonetto, F. Fiori","doi":"10.1109/ISEMC.2015.7256129","DOIUrl":null,"url":null,"abstract":"This paper discusses the pros and cons of the EMIRR, a parameter used to indicate the susceptibility of Operational Amplifiers to ElectroMagnetic Interference. Such a parameter is defined assuming a quadratic relationship between the interference amplitude and the EMI-induced offset. This work shows through analyses and experimental tests that such an assumption is valid only in particular cases, meaning that the application of the EMIRR is limited.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"On the effectiveness of EMIRR to qualify OpAmps\",\"authors\":\"Marco Brignone Aimonetto, F. Fiori\",\"doi\":\"10.1109/ISEMC.2015.7256129\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the pros and cons of the EMIRR, a parameter used to indicate the susceptibility of Operational Amplifiers to ElectroMagnetic Interference. Such a parameter is defined assuming a quadratic relationship between the interference amplitude and the EMI-induced offset. This work shows through analyses and experimental tests that such an assumption is valid only in particular cases, meaning that the application of the EMIRR is limited.\",\"PeriodicalId\":412708,\"journal\":{\"name\":\"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2015.7256129\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2015.7256129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper discusses the pros and cons of the EMIRR, a parameter used to indicate the susceptibility of Operational Amplifiers to ElectroMagnetic Interference. Such a parameter is defined assuming a quadratic relationship between the interference amplitude and the EMI-induced offset. This work shows through analyses and experimental tests that such an assumption is valid only in particular cases, meaning that the application of the EMIRR is limited.
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