混合finfet -忆阻器技术中250mhz -1.6 GHz锁相环设计

Naheem Olakunle Adesina, A. Srivastava
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引用次数: 5

摘要

在CMOS技术中,通过缩小晶体管的尺寸,晶体管的性能得到了巨大的提高。然而,存在着各种各样的挑战,例如与小型化相关的短通道效应(SCE)。FinFET技术是一种很有前途的技术,可以克服这些问题,因为随着技术的缩小,它比平面CMOS晶体管提供更好的通道静电控制。在这项工作中,我们提出了一个锁相环(PLL)设计与FinFET和忆阻器。回路滤波器的阻性和容性(R-C)元件分别替换为忆阻器和忆电容,以减小芯片面积,降低功耗。所设计的锁相环在中心频率为1ghz时的调谐范围为0.25 ~ 1.60 GHz,平均功耗为2.05 mW。在锁相环中,压控振荡器(VCO)对总相位噪声的贡献最大,在1 MHz偏移频率下,其相位噪声为-135.2 dBc/Hz。此外,锁相环在温度变化范围很广的情况下具有很高的可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 250 MHz-to-1.6 GHz Phase Locked Loop Design in Hybrid FinFET-Memristor Technology
There are tremendous improvements in performance of transistor in CMOS technology by scaling down its size. However, there are various challenges, such as short channel effects (SCE), that are associated with miniaturization. FinFET technology is a promising technique to overcome these issues because it offers better electrostatic control of the channel than planar CMOS transistor as the technology scales down. In this work, we have proposed a phase locked loop (PLL) design with FinFET and memristor. The resistive and capacitive (R-C) components of loop filter are replaced with memristor and memcapacitor, respectively, in order to minimize the die area and reduce power consumption. The designed PLL produces a tuning range of 0.25 - 1.60 GHz at center frequency of 1 GHz with 2.05 mW average power consumption. The voltage-controlled oscillator (VCO), which contributes majorly to the total phase noise in phase locked loop, has a phase noise -135.2 dBc/Hz at 1 MHz offset frequency. In addition, the PLL shows high reliability with wide variations in temperature.
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