硅环调制器的参数蒙特卡罗表征

2021 IEEE 17th International Conference on Group IV Photonics (GFP) Pub Date : 2021-12-01 DOI:10.1109/GFP51802.2021.9673952

Youngkwan Jo, Yongjin Ji, Minkyu Kim, S. Lischke, C. Mai, L. Zimmermann, W. Choi

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引用次数: 0

摘要

基于实验确定的关键行为模型参数分布，基于硅环调制器等效电路对调制频率响应进行蒙特卡罗表征。这种蒙特卡罗表征允许预测Si光子集成电路设计的性能指标的统计分布。

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Parametric Monte-Carlo Characterization of Si Ring Modulators

Monte-Carlo characterization based on the Si ring modulator equivalent circuit is performed for the modulation frequency responses based on experimentally determined key behavior model parameter distributions. Such Montel-Carlo characterization allows prediction of the statistical distribution of the performance metrics for Si photonic integrated circuit design.

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2021 IEEE 17th International Conference on Group IV Photonics (GFP)

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