{"title":"纳米CMOS的研究现状及未来发展方向","authors":"H. Iwai","doi":"10.1109/IWNC.2006.4570971","DOIUrl":null,"url":null,"abstract":"Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 5 nm gate length CMOS was reported in a conference. However, many serious problems are expected for implementing small-geometry MOSFETs into large scale integrated circuits even for 45 nm technology node, and it is still questionable if we can successfully introduce sub-10 nm CMOS LSIs into market, because the problems expected at this moment - such as Ion/Ioff ratio, current drive, variation in the electrical characteristics, concerns for the yield, reliability and manufacturing cost. Considering the above situation, we formed a leading research group for future ultra-low power nano-CMOS technology in 2003 - 2006, by the Special Coordination Funds for Promoting Science and Technology sponsored by Ministry of Education, Culture, Sports, Science and Technology, Japan, in order to conduct nano-CMOS studies in advance to provide possible solutions to the future expected problems. The conclusion obtained by the group study was that, in the Nano-CMOS era, aggressive introduction of new materials, processes, structures, and operation concepts is required to solve the problems. Also, new physical analysis technique and physical model in order to predict and explain the atomic scale phenomena and properties at the new material interfaces are important. Unfortunately, there are no candidates among the so-called 'beyond CMOS' new devices, which are believed to really replace CMOS transistors usable for the products of highly integrated circuits within 20 years. Thus, our opinion is that we need to still continue CMOS based transistors - CMOS with FinFET, Nanowire FET, and even CNTFET - with 'More Moore' approach with combining that of 'More than Moore'.","PeriodicalId":356139,"journal":{"name":"2006 International Workshop on Nano CMOS","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Recent status on Nano CMOS and future direction\",\"authors\":\"H. Iwai\",\"doi\":\"10.1109/IWNC.2006.4570971\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 5 nm gate length CMOS was reported in a conference. However, many serious problems are expected for implementing small-geometry MOSFETs into large scale integrated circuits even for 45 nm technology node, and it is still questionable if we can successfully introduce sub-10 nm CMOS LSIs into market, because the problems expected at this moment - such as Ion/Ioff ratio, current drive, variation in the electrical characteristics, concerns for the yield, reliability and manufacturing cost. Considering the above situation, we formed a leading research group for future ultra-low power nano-CMOS technology in 2003 - 2006, by the Special Coordination Funds for Promoting Science and Technology sponsored by Ministry of Education, Culture, Sports, Science and Technology, Japan, in order to conduct nano-CMOS studies in advance to provide possible solutions to the future expected problems. 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引用次数: 4
摘要
近年来,CMOS的小型化进程在生产和研究层面都得到了极大的加快,甚至在一次会议上报道了5nm栅极长CMOS的晶体管运行情况。然而,即使在45纳米技术节点上,将小几何尺寸的mosfet实现到大规模集成电路中也存在许多严重的问题,并且我们是否能够成功地将10纳米以下的CMOS lsi引入市场仍然值得怀疑,因为目前预计的问题-例如离子/ off比,电流驱动,电气特性的变化,对产量,可靠性和制造成本的担忧。考虑到上述情况,我们于2003 - 2006年在日本文部科学省科技促进特别协调基金的资助下,成立了未来超低功耗纳米cmos技术的领先研究小组,提前开展纳米cmos研究,为未来可能出现的问题提供可能的解决方案。小组研究得出的结论是,在纳米cmos时代,需要积极引入新的材料、工艺、结构和操作理念来解决问题。此外,新的物理分析技术和物理模型对于预测和解释新材料界面的原子尺度现象和性质也很重要。不幸的是,在所谓的“超越CMOS”的新器件中,没有候选人,这被认为是在20年内真正取代可用于高度集成电路产品的CMOS晶体管。因此,我们的观点是,我们仍然需要继续以CMOS为基础的晶体管- CMOS与FinFET,纳米线FET,甚至CNTFET -与“More than Moore”相结合的“More Moore”方法。
Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 5 nm gate length CMOS was reported in a conference. However, many serious problems are expected for implementing small-geometry MOSFETs into large scale integrated circuits even for 45 nm technology node, and it is still questionable if we can successfully introduce sub-10 nm CMOS LSIs into market, because the problems expected at this moment - such as Ion/Ioff ratio, current drive, variation in the electrical characteristics, concerns for the yield, reliability and manufacturing cost. Considering the above situation, we formed a leading research group for future ultra-low power nano-CMOS technology in 2003 - 2006, by the Special Coordination Funds for Promoting Science and Technology sponsored by Ministry of Education, Culture, Sports, Science and Technology, Japan, in order to conduct nano-CMOS studies in advance to provide possible solutions to the future expected problems. The conclusion obtained by the group study was that, in the Nano-CMOS era, aggressive introduction of new materials, processes, structures, and operation concepts is required to solve the problems. Also, new physical analysis technique and physical model in order to predict and explain the atomic scale phenomena and properties at the new material interfaces are important. Unfortunately, there are no candidates among the so-called 'beyond CMOS' new devices, which are believed to really replace CMOS transistors usable for the products of highly integrated circuits within 20 years. Thus, our opinion is that we need to still continue CMOS based transistors - CMOS with FinFET, Nanowire FET, and even CNTFET - with 'More Moore' approach with combining that of 'More than Moore'.