局部放电在定子棒半导体槽镀层缺陷识别中的改进

F. Pereira, H. Tatizawa, M. Zanotti
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引用次数: 0

摘要

目前的工作描述了如何利用局部放电(PD)测试改进位于高压棒(或线圈)槽部分的表面缺陷的检测。尽管如此,在制造过程中或随后的现场安装过程中,最终可能会产生能够破坏棒材半导体槽涂层的表面缺陷。虽然最常用的寻找表面缺陷的方法是基于视觉检查,但这项工作将通过使用电学方法(如PD脉冲的获取和识别)来探索这种方法的可能改进。这里显示的结果代表了一个更大的正在进行的项目的第一个进度报告,该项目旨在开发一种适合棒材和线圈批量生产质量控制的测试方法。为了在实验室规模上解决这个问题,产生了一系列人为制造的缺陷,并用不同的参数系统地进行了测试。采用了若干试验条件来确定在何种情况下,试验可以足够敏感,以允许对表面损伤进行清晰的检测和区分。我们发现,虽然仅仅记录PD振幅是一种更简单和直接的检测方法,但只有对完整的PD模式进行分析才能提供最有用的信息来识别缺陷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improvements in the Identification of Defects on the Semiconducting Slot Coating of Stator Bars Using Partial Discharges
The present work describes how the detection of surface defects located in the slot portion of high-voltage bars (or coils) can be improved with the use of partial discharge (PD) tests. In spite of all care, surface defects capable of damaging the semiconducting slot coating of bars can eventually be created during their manufacturing process or later on, during their installation at site. Although the most commonly used methods to search for surface defects are based upon visual inspections, this work will explore a possible improvement in such methodologies by using electrical methods, such as the acquisition and discrimination of PD pulses. The results shown here represent a first progress report of a larger ongoing project that aims to develop a test method suitable for the quality control of bars and coils mass production. To address the topic in laboratory scale, a series of artificially created defects were produced and systematically tested with different parameters. A number of test conditions was employed to determine under which circumstances the test can be sensitive enough to permit a clear detection and discrimination of the surface damages. It was found that although the mere recording of PD amplitudes is a simpler and straightforward method of detection, it is the analysis of the complete PD patterns that provides the most useful information to identify the defects.
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