沿P-E循环的Flash编程动力学的无松弛特性

2015 IEEE International Integrated Reliability Workshop (IIRW) Pub Date : 2015-10-01 DOI:10.1109/IIRW.2015.7437082

J. Coignus, A. Vernhet, G. Reimbold, G. Torrente, S. Renard, D. Roy

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引用次数: 6

摘要

提出了一种新颖的Flash耐久性表征方法，允许无延迟的READ操作，从而在任何器件松弛之前的每个周期都具有逼真的静电描述。热载流子编程过程中与时间相关的漏极电流的系统测量显示，提供了5ns时间分辨率的Flash编程动力学的扩展描述，包括隧道氧化物传输。

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Relaxation-free characterization of Flash programming dynamics along P-E cycling

A novel Flash endurance characterization approach is presented, allowing delay-free READ operations and thus a realistic electrostatic description at each cycle before any device relaxation. Systematic measurement of time-dependent drain current during Hot Carrier programming is shown to provide an extended description of Flash programming dynamics with a 5ns time resolution, including tunnel oxide transport.

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2015 IEEE International Integrated Reliability Workshop (IIRW)

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