遗传算法在断层注入制图中的加速量化

Idris Rais-Ali, Antoine Bouvet, S. Guilley
{"title":"遗传算法在断层注入制图中的加速量化","authors":"Idris Rais-Ali, Antoine Bouvet, S. Guilley","doi":"10.1109/FDTC57191.2022.00016","DOIUrl":null,"url":null,"abstract":"In the context of Fault Injection Analyses, the determination of the correct set of physical perturbation parameters is critical. When searching for vulnerabilities against fault injections, it is then a necessity to carry out a cartography in order to establish which tuples of parameters allow to disturb the target successfully, in a reliable way. In practice, this task is often time consuming because of the large number of dimensions to consider, hence an exhaustive cartography is most of the time impossible.This paper analyses three different cartography strategies: Linear-Scan, Monte-Carlo, and Genetic Algorithm-based methods. We compare them in real Electro-Magnetic Fault Injection Analyses on an hardware device, distinguishing two different contexts, namely with few, and, at the opposite, with more Points of Interest. We show that Genetic Algorithms are always better for identifying Areas of Interest, and so correct injection parameters, which is crucial for characterizing vulnerabilities in security evaluation contexts.","PeriodicalId":196228,"journal":{"name":"2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Quantifying the Speed-Up Offered by Genetic Algorithms during Fault Injection Cartographies\",\"authors\":\"Idris Rais-Ali, Antoine Bouvet, S. Guilley\",\"doi\":\"10.1109/FDTC57191.2022.00016\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the context of Fault Injection Analyses, the determination of the correct set of physical perturbation parameters is critical. When searching for vulnerabilities against fault injections, it is then a necessity to carry out a cartography in order to establish which tuples of parameters allow to disturb the target successfully, in a reliable way. In practice, this task is often time consuming because of the large number of dimensions to consider, hence an exhaustive cartography is most of the time impossible.This paper analyses three different cartography strategies: Linear-Scan, Monte-Carlo, and Genetic Algorithm-based methods. We compare them in real Electro-Magnetic Fault Injection Analyses on an hardware device, distinguishing two different contexts, namely with few, and, at the opposite, with more Points of Interest. We show that Genetic Algorithms are always better for identifying Areas of Interest, and so correct injection parameters, which is crucial for characterizing vulnerabilities in security evaluation contexts.\",\"PeriodicalId\":196228,\"journal\":{\"name\":\"2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FDTC57191.2022.00016\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FDTC57191.2022.00016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在故障注入分析中,确定正确的物理扰动参数集是至关重要的。在搜索针对故障注入的漏洞时,有必要执行制图,以便确定哪些参数元组允许以可靠的方式成功地干扰目标。在实践中,这项任务通常很耗时,因为要考虑大量的维度,因此在大多数情况下,详尽的制图是不可能的。本文分析了三种不同的制图策略:线性扫描、蒙特卡罗和基于遗传算法的方法。我们在硬件设备的实际电磁故障注入分析中对它们进行了比较,区分了两种不同的上下文,即较少的兴趣点,相反,有更多的兴趣点。我们表明遗传算法总是更好地识别感兴趣的领域,因此正确的注入参数,这对于在安全评估环境中表征漏洞至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Quantifying the Speed-Up Offered by Genetic Algorithms during Fault Injection Cartographies
In the context of Fault Injection Analyses, the determination of the correct set of physical perturbation parameters is critical. When searching for vulnerabilities against fault injections, it is then a necessity to carry out a cartography in order to establish which tuples of parameters allow to disturb the target successfully, in a reliable way. In practice, this task is often time consuming because of the large number of dimensions to consider, hence an exhaustive cartography is most of the time impossible.This paper analyses three different cartography strategies: Linear-Scan, Monte-Carlo, and Genetic Algorithm-based methods. We compare them in real Electro-Magnetic Fault Injection Analyses on an hardware device, distinguishing two different contexts, namely with few, and, at the opposite, with more Points of Interest. We show that Genetic Algorithms are always better for identifying Areas of Interest, and so correct injection parameters, which is crucial for characterizing vulnerabilities in security evaluation contexts.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信