基于改进支持向量机的IGBT开路故障诊断

Zhiqiang Geng, Qi Wang, Yongming Han
{"title":"基于改进支持向量机的IGBT开路故障诊断","authors":"Zhiqiang Geng, Qi Wang, Yongming Han","doi":"10.1109/ICCSS53909.2021.9722023","DOIUrl":null,"url":null,"abstract":"Modular multilevel converter (MMC) is a new type of the voltage source converter, which is widely used in the flexible DC transmission and motor drive. However, the MMC is composed of a large number of sub-modules, which poses a huge difficulty for accurately locating the specific sub-module that has a fault. Therefore, this paper proposes an improved support vector machine (SVM) based on the overlapped wavelet packet transform (MODWPT) to diagnose the open circuit fault of the insulated gate bipolar transistor (IGBT) of the MMC sub-module. The MODWPT is used for the feature extraction, then the k-fold cross-validation can group fault feature data sets to evaluate the performance of SVM classifiers, which can effectively reduce the generalization error of the fault diagnosis model. Based on the MMC fault simulation model of the PSCAD platform, the experimental results show that the average fault diagnosis accuracy of the improved SVM based on the MODWPT is 99.78%, which has better classification accuracy and reliability than the traditional SVM, the back propagation neural network and Bayesian.","PeriodicalId":435816,"journal":{"name":"2021 8th International Conference on Information, Cybernetics, and Computational Social Systems (ICCSS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"IGBT Open Circuit Fault Diagnosis Based on Improved Support Vector Machine\",\"authors\":\"Zhiqiang Geng, Qi Wang, Yongming Han\",\"doi\":\"10.1109/ICCSS53909.2021.9722023\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Modular multilevel converter (MMC) is a new type of the voltage source converter, which is widely used in the flexible DC transmission and motor drive. However, the MMC is composed of a large number of sub-modules, which poses a huge difficulty for accurately locating the specific sub-module that has a fault. Therefore, this paper proposes an improved support vector machine (SVM) based on the overlapped wavelet packet transform (MODWPT) to diagnose the open circuit fault of the insulated gate bipolar transistor (IGBT) of the MMC sub-module. The MODWPT is used for the feature extraction, then the k-fold cross-validation can group fault feature data sets to evaluate the performance of SVM classifiers, which can effectively reduce the generalization error of the fault diagnosis model. Based on the MMC fault simulation model of the PSCAD platform, the experimental results show that the average fault diagnosis accuracy of the improved SVM based on the MODWPT is 99.78%, which has better classification accuracy and reliability than the traditional SVM, the back propagation neural network and Bayesian.\",\"PeriodicalId\":435816,\"journal\":{\"name\":\"2021 8th International Conference on Information, Cybernetics, and Computational Social Systems (ICCSS)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 8th International Conference on Information, Cybernetics, and Computational Social Systems (ICCSS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCSS53909.2021.9722023\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 8th International Conference on Information, Cybernetics, and Computational Social Systems (ICCSS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCSS53909.2021.9722023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

模块化多电平变换器(MMC)是一种新型的电压源变换器,广泛应用于柔性直流传动和电机驱动中。然而,MMC由大量子模块组成,这给准确定位发生故障的特定子模块带来了巨大的困难。为此,本文提出了一种基于重叠小波包变换(MODWPT)的改进支持向量机(SVM)来诊断MMC子模块的绝缘栅双极晶体管(IGBT)的开路故障。采用MODWPT进行特征提取,然后通过k-fold交叉验证对故障特征数据集进行分组,评价SVM分类器的性能,有效降低了故障诊断模型的泛化误差。基于PSCAD平台的MMC故障仿真模型,实验结果表明,基于MODWPT的改进支持向量机的平均故障诊断准确率为99.78%,比传统支持向量机、bp神经网络和贝叶斯具有更好的分类精度和可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
IGBT Open Circuit Fault Diagnosis Based on Improved Support Vector Machine
Modular multilevel converter (MMC) is a new type of the voltage source converter, which is widely used in the flexible DC transmission and motor drive. However, the MMC is composed of a large number of sub-modules, which poses a huge difficulty for accurately locating the specific sub-module that has a fault. Therefore, this paper proposes an improved support vector machine (SVM) based on the overlapped wavelet packet transform (MODWPT) to diagnose the open circuit fault of the insulated gate bipolar transistor (IGBT) of the MMC sub-module. The MODWPT is used for the feature extraction, then the k-fold cross-validation can group fault feature data sets to evaluate the performance of SVM classifiers, which can effectively reduce the generalization error of the fault diagnosis model. Based on the MMC fault simulation model of the PSCAD platform, the experimental results show that the average fault diagnosis accuracy of the improved SVM based on the MODWPT is 99.78%, which has better classification accuracy and reliability than the traditional SVM, the back propagation neural network and Bayesian.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信