带超小死区的子采样锁相环可减少锁相时间

Yeqing Wang, Zhouchen Ma, Yan Liu, Jian Zhao, Lei Zhang, Zongmin Wang
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引用次数: 1

摘要

本文提出了一种锁相时间较短的次采样锁相环。提出了一个超小死区来增加高增益锁频环的工作区域,从而实现快速稳定。采用相位误差自适应充电泵控制方案,根据剩余的相位误差对相位/频率检测器的输出进行调整。仿真结果表明,该系统的稳定时间为2.5 μs。当对压控振荡器的控制电压施加100或500 mV的阶跃变化时,系统需要2 μs或1.25 μs才能重新锁定。当分频比从44降低到43时,系统恢复到锁定状态需要2 μs。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sub-Sampling Phase-Locked Loop with Ultra-mini Dead Zone For Locking Time Reduction
This paper presents a sub-sampling phase-locked loop with shorter locking time. An ultra-mini dead zone is proposed to increase the operation region of the high-gain frequency-locked loop, such that a fast settling can be achieved. A phase error adaptive charging pump control scheme is implemented to tune the phase/frequency detector’s outputs according to the remaining phase error. Simulation results show that it takes 2.5 μs for the system to settle down. When a step change of 100 or 500 mV is applied on the control voltage of the voltage-controlled oscillator, it takes 2 μs or 1.25 μs for the system to re-lock. When the divider ratio is reduced from 44 to 43, it takes 2 μs for the system to return to the locking state.
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