{"title":"阴极发射面局部化对电真空器件性能的影响","authors":"M. Glumova, M. Vorobyov","doi":"10.1109/CRMICO.2001.961534","DOIUrl":null,"url":null,"abstract":"The authors propose a method of quantitative description of regularities, related to the influence of dimensions and localization of different areas of the cathode emitting surface, on the volt-amp diagrams. They report numerical experiments in the field of cathode electronics, including the usage of the basic system containing cathodes with edge screening.","PeriodicalId":197471,"journal":{"name":"11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Influence of localization of cathode emitting surface on electrovacuum device properties\",\"authors\":\"M. Glumova, M. Vorobyov\",\"doi\":\"10.1109/CRMICO.2001.961534\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors propose a method of quantitative description of regularities, related to the influence of dimensions and localization of different areas of the cathode emitting surface, on the volt-amp diagrams. They report numerical experiments in the field of cathode electronics, including the usage of the basic system containing cathodes with edge screening.\",\"PeriodicalId\":197471,\"journal\":{\"name\":\"11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2001.961534\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2001.961534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of localization of cathode emitting surface on electrovacuum device properties
The authors propose a method of quantitative description of regularities, related to the influence of dimensions and localization of different areas of the cathode emitting surface, on the volt-amp diagrams. They report numerical experiments in the field of cathode electronics, including the usage of the basic system containing cathodes with edge screening.