脉冲激光集成电路的时间分辨扫描:在ADC瞬态故障注入中的应用

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI:10.1109/IMTC.2003.1207976

V. Pouget, D. Lewis, P. Fouillat

{"title":"脉冲激光集成电路的时间分辨扫描:在ADC瞬态故障注入中的应用","authors":"V. Pouget, D. Lewis, P. Fouillat","doi":"10.1109/IMTC.2003.1207976","DOIUrl":null,"url":null,"abstract":"This paper presents an experimental system for integrated circuits testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8 bit half-flash ADC.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC\",\"authors\":\"V. Pouget, D. Lewis, P. Fouillat\",\"doi\":\"10.1109/IMTC.2003.1207976\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an experimental system for integrated circuits testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8 bit half-flash ADC.\",\"PeriodicalId\":135321,\"journal\":{\"name\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2003.1207976\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1207976","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

本文介绍了一种脉冲激光测试集成电路的实验系统。该系统是全自动的，同时为各种应用提供有趣的空间和时间分辨率，如断层注入、辐射灵敏度评估或默认定位。在本应用中，该系统用于显示8位半闪存ADC中的信号传播。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

This paper presents an experimental system for integrated circuits testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8 bit half-flash ADC.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)

自引率

0.00%

发文量