硅光伏组件20年野外暴露后的诊断分析

Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036) Pub Date : 2000-09-25 DOI:10.1109/PVSC.2000.916159

M. Quintana, D. King, F. Hosking, J. Kratochvil, R.W. Johnson, B. Hansen, N. Dhere, M. Pandit

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引用次数: 38

摘要

本研究的目的是调查Spectrolab公司用于制造光伏组件的技术，该技术已在犹他州东南部的天然桥梁国家纪念碑提供了20年的可靠服务。现场调查、系统性能测试以及一系列模块和材料测试证实了阵列中模块的耐用性。Spectrolab使用的制造工艺、材料和质量控制相结合，导致模块在20年内保持了接近原始规格的性能水平。组件耐久性的具体贡献者包括聚乙烯醇-丁醛(PVB)封装剂、膨胀金属互连、氧化硅抗反射涂层以及出色的焊料/衬底可焊性。

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Diagnostic analysis of silicon photovoltaic modules after 20-year field exposure

The objective of this study was to investigate the technology used by Spectrolab Inc. to manufacture photovoltaic modules that have provided twenty years of reliable service at Natural Bridges National Monument in southeastern Utah. A field survey, system performance tests, and a series of module and materials tests have confirmed the durability of the modules in the array. The combination of manufacturing processes, materials, and quality controls used by Spectrolab resulted in modules that have maintained a performance level close to the original specifications for twenty years. Specific contributors to the durability of the modules included polyvinyl-butyral (PVB) encapsulant, expanded metal interconnects, silicon oxide anti-reflective coating, and excellent solder/substrate solderability.

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Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036)

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