铁离子注入外延生长InP制备半绝缘埋层的研究

A. Carnera, A. Gasparotto, M. Caldironi, S. Pellegrino, M. Tromby, F. Vidimari, C. Frigeri
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引用次数: 0

摘要

讨论了利用选择性离子注入铁在inp基外延结构中实现半绝缘埋层的方法。结果表明,通过选择性地向InP中植入铁,然后进行外延过度生长,可以制造出埋藏的半绝缘电流阻断区。对相关物理过程的研究揭示了许多有趣的方面。在非晶化阈值以上或以下植入样品的退火行为之间存在明显差异。重点研究了非晶层的固相外延生长和铁的重分布和偏析机制
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the production of semi-insulating buried layers in epitaxially grown InP by Fe ion implantation
The realization of a semi-insulating buried layer in a InP-based epitaxial structure is discussed by the selective ion implantation of Fe. Results indicate the feasibility of the production of a buried semi-insulating, current-blocking region with the selective implant of Fe into InP followed by an epitaxial overgrowth. The study of the involved physical processes revealed many interesting aspects. A strong difference is evidenced between the annealing behavior of samples implanted above or below the amorphization threshold. Particular attention has been devoted to the study of the solid phase epitaxial growth of the amorphous layer and of the Fe redistribution and segregation mechanisms.<>
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