多导体、多层、损耗各向异性结构的谱域分析

R. Boix
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引用次数: 0

摘要

本文简要介绍了谱域法(SDA)在多层、各向异性和有损衬底中嵌入的多导体平面结构分析中的应用。作者根据自己的经验,对谱格林函数的数值计算、未知场源(电流密度、电荷密度等)在空间域基函数的选择以及应用SDA时需要计算的无穷级数和积分的数值计算提出了几点建议。给出了平面传输线(微带、共面波导、带状线)、微带不连续和微带谐振器的特性参数的一些结果。这些结果是利用SDA获得的,作为该数值技术在多层、各向异性和有损衬底中嵌入的平面结构表征中的应用实例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Spectral Domain Analysis of Multiconductor, Multilayered, Lossy Anisotropic Structures
In this paper, the author briefly revises the application of the spectral domain approach (SDA) to the analysis of multiconductor planar structures embedded in multilayered, anisotropic and lossy substrates. By using his own experience, the author provides several advices concerning the numerical computation of the spectral Green's function, concerning the choice of basis functions in the spatial domain for the unknown field sources (current densities, charge densities, ...), and concerning the numerical evaluation of the infinite series and integrals which have to be computed when applying the SDA. Some results are presented for the characteristic parameters of planar transmission lines (microstrips, coplanar waveguides, striplines), microstrip discontinuities and microstrip resonators. These results, which have been obtained by using the SDA, are provided as examples of the application of this numerical technique to the characterization of planar structures embedded in multilayered, anisotropic and lossy substrates.
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