{"title":"CMOS技术兼容磁存储器","authors":"V. Sverdlov, S. Selberherr","doi":"10.1109/ISNE.2019.8896421","DOIUrl":null,"url":null,"abstract":"With CMOS transistors’ scaling showing signs of saturation, an exploration of new working principles suitable for emerging microelectronic devices accelerates. The electron spin is attractive for new device applications as a complement and a possible replacement of the electron charge currently employed by CMOS. The electron spin displays the two well-defined projections on an axis and is thus suitable for digital applications. In magnetic tunnel junctions (MTJs) the free magnetic layer possesses two orientations relative to the fixed layer: parallel and antiparallel. As the parallel and antiparallel magnetization configurations are characterized by different resistances, the thereby stored information can be read. MTJs enable a spin-based type of non-volatile magnetoresistive memory. MTJs are fabricated with a CMOS-friendly process and are quite CMOS compatible. The relative magnetization configuration can be written by means of a spin-transfer torque (STT) or a spin-orbit torque (SOT) acting on the free layer. The torques are caused by spin-polarized electrical currents and not by a magnetic field. Electrically addressable non-volatile magnetoresistive memories are attractive for stand-alone and embedded applications. The state-of-the art concepts of STT and SOT memory, in particular the required modeling approaches, are reviewed, with a particular focus on a fast external magnetic field free switching in advanced SOT-MRAM.","PeriodicalId":405565,"journal":{"name":"2019 8th International Symposium on Next Generation Electronics (ISNE)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"CMOS Technology Compatible Magnetic Memories\",\"authors\":\"V. Sverdlov, S. Selberherr\",\"doi\":\"10.1109/ISNE.2019.8896421\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With CMOS transistors’ scaling showing signs of saturation, an exploration of new working principles suitable for emerging microelectronic devices accelerates. The electron spin is attractive for new device applications as a complement and a possible replacement of the electron charge currently employed by CMOS. The electron spin displays the two well-defined projections on an axis and is thus suitable for digital applications. In magnetic tunnel junctions (MTJs) the free magnetic layer possesses two orientations relative to the fixed layer: parallel and antiparallel. As the parallel and antiparallel magnetization configurations are characterized by different resistances, the thereby stored information can be read. MTJs enable a spin-based type of non-volatile magnetoresistive memory. MTJs are fabricated with a CMOS-friendly process and are quite CMOS compatible. The relative magnetization configuration can be written by means of a spin-transfer torque (STT) or a spin-orbit torque (SOT) acting on the free layer. The torques are caused by spin-polarized electrical currents and not by a magnetic field. Electrically addressable non-volatile magnetoresistive memories are attractive for stand-alone and embedded applications. The state-of-the art concepts of STT and SOT memory, in particular the required modeling approaches, are reviewed, with a particular focus on a fast external magnetic field free switching in advanced SOT-MRAM.\",\"PeriodicalId\":405565,\"journal\":{\"name\":\"2019 8th International Symposium on Next Generation Electronics (ISNE)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 8th International Symposium on Next Generation Electronics (ISNE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISNE.2019.8896421\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 8th International Symposium on Next Generation Electronics (ISNE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISNE.2019.8896421","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
With CMOS transistors’ scaling showing signs of saturation, an exploration of new working principles suitable for emerging microelectronic devices accelerates. The electron spin is attractive for new device applications as a complement and a possible replacement of the electron charge currently employed by CMOS. The electron spin displays the two well-defined projections on an axis and is thus suitable for digital applications. In magnetic tunnel junctions (MTJs) the free magnetic layer possesses two orientations relative to the fixed layer: parallel and antiparallel. As the parallel and antiparallel magnetization configurations are characterized by different resistances, the thereby stored information can be read. MTJs enable a spin-based type of non-volatile magnetoresistive memory. MTJs are fabricated with a CMOS-friendly process and are quite CMOS compatible. The relative magnetization configuration can be written by means of a spin-transfer torque (STT) or a spin-orbit torque (SOT) acting on the free layer. The torques are caused by spin-polarized electrical currents and not by a magnetic field. Electrically addressable non-volatile magnetoresistive memories are attractive for stand-alone and embedded applications. The state-of-the art concepts of STT and SOT memory, in particular the required modeling approaches, are reviewed, with a particular focus on a fast external magnetic field free switching in advanced SOT-MRAM.