{"title":"一种确定非同轴器件s参数的替代方法","authors":"J. Sroka","doi":"10.1109/CPEE.2015.7333374","DOIUrl":null,"url":null,"abstract":"Non-coaxial (non-insertable) devices are indispensable by EMC testing. Absorbing clamps belong to them. They are verified with the Vector Network Analyzers (VNA) which unfortunately have coaxial ports. The clamp can be connected to the VNA only if it is embedded in adapters. By verification the clamp must be de-embedded i.e. the contribution of adapters must be extracted from the measured S-parameters. The Thru-Reflect-Line (TRL) calibration of the VNA would be suitable tool for this task, but this function is only optional in the firmwares of the VNAs. In this paper the alternative approach consisted in calibration with the Short-Open-Thru-Match (SOTM), supplemented with the measurements of all S-parameters of the two adapters cascaded face to face is presented. Applicability of the method is verified metrologically.","PeriodicalId":135123,"journal":{"name":"2015 16th International Conference on Computational Problems of Electrical Engineering (CPEE)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2015-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An alternative approach to determination of the S-parameters of noncoaxial devices\",\"authors\":\"J. Sroka\",\"doi\":\"10.1109/CPEE.2015.7333374\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Non-coaxial (non-insertable) devices are indispensable by EMC testing. Absorbing clamps belong to them. They are verified with the Vector Network Analyzers (VNA) which unfortunately have coaxial ports. The clamp can be connected to the VNA only if it is embedded in adapters. By verification the clamp must be de-embedded i.e. the contribution of adapters must be extracted from the measured S-parameters. The Thru-Reflect-Line (TRL) calibration of the VNA would be suitable tool for this task, but this function is only optional in the firmwares of the VNAs. In this paper the alternative approach consisted in calibration with the Short-Open-Thru-Match (SOTM), supplemented with the measurements of all S-parameters of the two adapters cascaded face to face is presented. Applicability of the method is verified metrologically.\",\"PeriodicalId\":135123,\"journal\":{\"name\":\"2015 16th International Conference on Computational Problems of Electrical Engineering (CPEE)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 16th International Conference on Computational Problems of Electrical Engineering (CPEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEE.2015.7333374\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 16th International Conference on Computational Problems of Electrical Engineering (CPEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEE.2015.7333374","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An alternative approach to determination of the S-parameters of noncoaxial devices
Non-coaxial (non-insertable) devices are indispensable by EMC testing. Absorbing clamps belong to them. They are verified with the Vector Network Analyzers (VNA) which unfortunately have coaxial ports. The clamp can be connected to the VNA only if it is embedded in adapters. By verification the clamp must be de-embedded i.e. the contribution of adapters must be extracted from the measured S-parameters. The Thru-Reflect-Line (TRL) calibration of the VNA would be suitable tool for this task, but this function is only optional in the firmwares of the VNAs. In this paper the alternative approach consisted in calibration with the Short-Open-Thru-Match (SOTM), supplemented with the measurements of all S-parameters of the two adapters cascaded face to face is presented. Applicability of the method is verified metrologically.