增透涂层的x射线辐照响应

C. Muller, T. Allanche, A. Morana, P. Paillet, T. Lépine, A. Boukenter, Y. Ouerdane, S. Girard
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引用次数: 0

摘要

在恶劣环境下的成像领域,在透镜上添加抗反射涂层可以增加传感器上的通量,并最大限度地减少鬼像。然而,辐射会影响这些涂层的性能。在本文中,我们研究了这种对市售抗反射涂层的影响,直到总电离剂量为1 MGy(SiO2)。在线辐射诱导衰减测量突出了未涂层和涂层样品之间的细微差异,这些差异在死后的透射和反射光谱中不能清楚地观察到。我们也报道了光致发光光谱。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-ray irradiation response of antireflection coatings
In the domain of imaging in harsh environments, adding antireflection coatings on lenses increases the flux on the sensor and minimizes the ghost images. However, the radiation can influence the performances of these coatings. In this paper, we studied such effects on commercially available antireflection coatings, up to the total ionizing dose of 1 MGy(SiO2). Online radiation-induced attenuation measurements highlight slight differences between uncoated and coated samples that are not clearly observable in post-mortem transmission and reflection spectra. We also report photoluminescence spectra.
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