光折变SBN中运行干涉图样的锁相检测

O. P. Nestiorkin, Y. Shershakov, B. Zel'dovich, N. Bogodaev, L. Ivleva
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引用次数: 0

摘要

光折变晶体中的全息光栅可以被记录下来,这是由于电子的扩散或它们在由静态干涉图样照明的外部或本征光伏直流场中的漂移造成的。这些传统机制得到了很好的研究[1]。运行干扰图可以通过锁相检测在外部施加的交流场中记录。该机制在准电晶体Bi12TiO20 (BTO)中实现[2,3]。在本工作中,我们在铁电光折变晶体SBN:Ce中实现了锁相检测机制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Phase-locked detection of running interference pattern in photorefractive SBN
Holographic grating in a photorefractive crystal may be recorded due to the diffusion of electrons or their drift in external or intrinsic photovoltaic dc field as a result of illumination by a static interference pattern. Those traditional mechanisms are well studied [1]. Running interference pattern may be registered by the phase-locked detection in the externally applied ac field. That mechanism was realized in the paraelectric crystal Bi12TiO20 (BTO) [2,3]. In this work we have performed the phase-locked detection mechanism in the ferroelectric photorefractive crystal SBN:Ce.
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