Pramod Subramanyan, Virendra Singh, K. Saluja, E. Larsson
{"title":"多路冗余执行:芯片多处理器中一种高效容错技术","authors":"Pramod Subramanyan, Virendra Singh, K. Saluja, E. Larsson","doi":"10.1109/DATE.2010.5457061","DOIUrl":null,"url":null,"abstract":"Continued CMOS scaling is expected to make future microprocessors susceptible to transient faults, hard faults, manufacturing defects and process variations causing fault tolerance to become important even for general purpose processors targeted at the commodity market.","PeriodicalId":432902,"journal":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","volume":"603 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":"{\"title\":\"Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors\",\"authors\":\"Pramod Subramanyan, Virendra Singh, K. Saluja, E. Larsson\",\"doi\":\"10.1109/DATE.2010.5457061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Continued CMOS scaling is expected to make future microprocessors susceptible to transient faults, hard faults, manufacturing defects and process variations causing fault tolerance to become important even for general purpose processors targeted at the commodity market.\",\"PeriodicalId\":432902,\"journal\":{\"name\":\"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)\",\"volume\":\"603 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"28\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DATE.2010.5457061\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.2010.5457061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors
Continued CMOS scaling is expected to make future microprocessors susceptible to transient faults, hard faults, manufacturing defects and process variations causing fault tolerance to become important even for general purpose processors targeted at the commodity market.