Y. Lee, Y. K. Kim, Taewan Kim, W. Park, I. Hwang, W. Jeong, Jang-eun Lee
{"title":"合成反铁磁自由层磁隧道结的开关特性","authors":"Y. Lee, Y. K. Kim, Taewan Kim, W. Park, I. Hwang, W. Jeong, Jang-eun Lee","doi":"10.1109/INTMAG.2005.1464451","DOIUrl":null,"url":null,"abstract":"The properties of sub-micrometer scaled MTJs using various synthetic antiferromagnetic (SAF) free layer were studied using remanent-state measurement. The magnetic tunnel junction device was a structure consisted of TiN/PtMn/CoFe/Ru/CoFe/AlO/NiFe/Ru/NiFe/Ta. It was found that junctions using single free layer showed complex switching behaviors with larger switching field variation while the junction using a specific SAF free layer exhibited kink-free R-H curves with less switching field variation. MR ratio and magnetization moment of the MTJ were also measured","PeriodicalId":273174,"journal":{"name":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Switching characteristics in magnetic tunnel junctions with a synthetic antiferromagentic free layer\",\"authors\":\"Y. Lee, Y. K. Kim, Taewan Kim, W. Park, I. Hwang, W. Jeong, Jang-eun Lee\",\"doi\":\"10.1109/INTMAG.2005.1464451\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The properties of sub-micrometer scaled MTJs using various synthetic antiferromagnetic (SAF) free layer were studied using remanent-state measurement. The magnetic tunnel junction device was a structure consisted of TiN/PtMn/CoFe/Ru/CoFe/AlO/NiFe/Ru/NiFe/Ta. It was found that junctions using single free layer showed complex switching behaviors with larger switching field variation while the junction using a specific SAF free layer exhibited kink-free R-H curves with less switching field variation. MR ratio and magnetization moment of the MTJ were also measured\",\"PeriodicalId\":273174,\"journal\":{\"name\":\"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INTMAG.2005.1464451\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTMAG.2005.1464451","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Switching characteristics in magnetic tunnel junctions with a synthetic antiferromagentic free layer
The properties of sub-micrometer scaled MTJs using various synthetic antiferromagnetic (SAF) free layer were studied using remanent-state measurement. The magnetic tunnel junction device was a structure consisted of TiN/PtMn/CoFe/Ru/CoFe/AlO/NiFe/Ru/NiFe/Ta. It was found that junctions using single free layer showed complex switching behaviors with larger switching field variation while the junction using a specific SAF free layer exhibited kink-free R-H curves with less switching field variation. MR ratio and magnetization moment of the MTJ were also measured