单晶硅掺杂锗优化shf晶体管参数

V. Afanas'ev, D. Brinkevich, A. Korzhenevski, V. Prosolovich, Yu.N. Yankovski
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引用次数: 0

摘要

设计了shf晶体管参数的优化方法。结果表明,在SiO/ sub2 /中掺入锗可以降低mos结构的泄漏电流,提高mos结构的击穿电压。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SHF-transistors parameters optimization by germanium doping of silicon monocrystal
Optimization method of the SHF-transistors parameters has been designed. It is shown that germanium incorporation into SiO/sub 2/ reduces the leakage current and increases the breakdown voltage of MOS-structures.
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